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Measuring the Beam Profile by Counting Ionization Electrons
H.S. Sandberg; W. Bertsche
Source PublicationProceedings of the 8th International Beam Instrumentation Conference
Conference Date2019
Conference PlaceSweden
Citation statistics
Cited Times:0 [INSPIRE]
Document Type会议论文
AffiliationUMAN, Manchester, United Kingdom
Recommended Citation
GB/T 7714
H.S. Sandberg,W. Bertsche. Measuring the Beam Profile by Counting Ionization Electrons[C],2019.
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