DATA ACQUISITION AND CONTROL SYSTEM FOR SAMSUNG SUPERCONDUCTOR TEST FACILITY

IHEP OpenIR > 学术会议 > 国际参会 > JaCoW高能所参会会议 > ICALEPCS

	DATA ACQUISITION AND CONTROL SYSTEM FOR SAMSUNG SUPERCONDUCTOR TEST FACILITY
	H. Choi; S. Baang; S. H. Baek; Y. B. Chang; J. H. Kim; J. S. Kim; K. Kim; M. K. Kim; S. B. Kim
	1999
会议（录）名称	Proceedings of the 7th International Conference on Accelerator & Large Experimental Physics Control Systems
会议日期	1999
会议地点	Italy
INSPIRE ID	517744
引用统计	被引频次：0 [INSPIRE]
文献类型	会议论文
条目标识符	https://ir.ihep.ac.cn/handle/311005/248525
专题	学术会议_国际参会_JaCoW高能所参会会议_ICALEPCS
作者单位	Institute of Technology, Taejon, Korea, J. Yee, Eulji Medical College, Taejon, Korea
推荐引用方式 GB/T 7714	H. Choi,S. Baang,S. H. Baek,et al. DATA ACQUISITION AND CONTROL SYSTEM FOR SAMSUNG SUPERCONDUCTOR TEST FACILITY[C],1999.