Monte Carlo simulation of the BEPC II/BESIII backgrounds - Touschek effect

IHEP OpenIR > 院士

	Monte Carlo simulation of the BEPC II/BESIII backgrounds - Touschek effect
其他题名	BEPCII束流相关本底的模特卡罗模拟研究（III）——TOUSCHEK效应
	Jin DP(金大鹏); Guo YN(过雅南); Wang YF(王艳凤); Wu LH(伍灵慧); Liu ZA(刘振安); Zhao DX(赵棣新); Yu ZQ(郁忠强); Jin, DP; Guo, YN; Wang, YF; Wu, LH; Liu, ZA; Zhao, DX; Yu, ZQ
	2006
发表期刊	HIGH ENERGY PHYSICS AND NUCLEAR PHYSICS-CHINESE EDITION
卷号	30 期号:5 页码:449-453
通讯作者	CAS, Inst High Energy Phys, Beijing 100049, Peoples R China ; CAS, Grad Sch, Beijing 100049, Peoples R China
文章类型	Article
摘要	Motivation of the Touschek backgrounds study is introduced. Also introduced are the theory and modeling methods of the Touschek effect. The Touschek backgrounds of the main detectors of the BESIII are studied in detail using the self-reprogrammed general simulation tools. Comparison of the beam lifetime between the simulated and calculated ones shows that the simulations are reasonable and the results are meaningful. Results of the detectors' backgrounds show that the Touschek backgrounds won't affect the normal run of the future BESIII and won't damage the main detectors.
关键词	Touschek effect single wire counting rate radiation dose background
学科领域	Physics
URL	查看原文
语种	英语
WOS研究方向	Physics
WOS类目	Physics, Nuclear ; Physics, Particles & Fields
WOS记录号	WOS:000237326500015
引用统计	正在获取...
文献类型	期刊论文
条目标识符	https://ir.ihep.ac.cn/handle/311005/237524
专题	院士实验物理中心中国科学院高能物理研究所_中国散裂中子源
作者单位	中国科学院高能物理研究所
第一作者单位	中国科学院高能物理研究所
推荐引用方式 GB/T 7714	Jin DP,Guo YN,Wang YF,et al. Monte Carlo simulation of the BEPC II/BESIII backgrounds - Touschek effect[J]. HIGH ENERGY PHYSICS AND NUCLEAR PHYSICS-CHINESE EDITION,2006,30(5):449-453.
APA	金大鹏.,过雅南.,王艳凤.,伍灵慧.,刘振安.,...&Yu, ZQ.(2006).Monte Carlo simulation of the BEPC II/BESIII backgrounds - Touschek effect.HIGH ENERGY PHYSICS AND NUCLEAR PHYSICS-CHINESE EDITION,30(5),449-453.
MLA	金大鹏,et al."Monte Carlo simulation of the BEPC II/BESIII backgrounds - Touschek effect".HIGH ENERGY PHYSICS AND NUCLEAR PHYSICS-CHINESE EDITION 30.5(2006):449-453.