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Electro-optical sampling non-synchronous delay scanning measurement of electron beam bunch length at BFEL
Sun DR(孙大睿); Xu JQ(徐金强); Chen SY(陈森玉); Sun, DR; Xu, JQ; Chen, SY
2010
Source PublicationCHINESE PHYSICS C
Volume34Issue:2Pages:#REF!
Corresponding AuthorSun, DR (reprint author), CAS, Inst High Energy Phys, Beijing 100049, Peoples R China.
SubtypeArticle
AbstractThe Electro-optical sampling delay scanning technique can be used for electron beam bunch length measurement. A novel non-synchronous delay scanning technique based on the electro-optical sampling measurements is presented. Based on Beijing Free Electron Laser (BFEL), the electron beam bunch length was measured with the electro-optical sampling technique for the first time in China. The result shows that the electron beam bunch length at BFEL is about 5.6 +/- 1.2 ps.
Keywordelectro-optical sampling measurement of electron beam bunch length non-synchronous delay scanning technique
Subject AreaPhysics
Indexed BySCI ; ADS
WOS SubjectPhysics, Nuclear ; Physics, Particles & Fields
WOS IDWOS:000274309200014
ADS Bibcode2010ChPhC..34..227S
ADS URLhttps://ui.adsabs.harvard.edu/abs/2010ChPhC..34..227S
ADS CITATIONShttps://ui.adsabs.harvard.edu/abs/2010ChPhC..34..227S/citations
Citation statistics
Cited Times:0 [ADS]
Document Type期刊论文
Identifierhttp://ir.ihep.ac.cn/handle/311005/227062
Collection院士
多学科研究中心
中国科学院高能物理研究所_所办公室
Recommended Citation
GB/T 7714
Sun DR,Xu JQ,Chen SY,et al. Electro-optical sampling non-synchronous delay scanning measurement of electron beam bunch length at BFEL[J]. CHINESE PHYSICS C,2010,34(2):#REF!.
APA 孙大睿,徐金强,陈森玉,Sun, DR,Xu, JQ,&Chen, SY.(2010).Electro-optical sampling non-synchronous delay scanning measurement of electron beam bunch length at BFEL.CHINESE PHYSICS C,34(2),#REF!.
MLA 孙大睿,et al."Electro-optical sampling non-synchronous delay scanning measurement of electron beam bunch length at BFEL".CHINESE PHYSICS C 34.2(2010):#REF!.
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