Electro-optical sampling non-synchronous delay scanning measurement of electron beam bunch length at BFEL

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	Electro-optical sampling non-synchronous delay scanning measurement of electron beam bunch length at BFEL
	Sun DR(孙大睿); Xu JQ(徐金强); Chen SY(陈森玉); Sun, DR; Xu, JQ; Chen, SY
	2010
发表期刊	CHINESE PHYSICS C (IF:5.084[JCR-2016],2.808[5-Year])
卷号	34 期号:2 页码:#REF!
通讯作者	Sun, DR (reprint author), CAS, Inst High Energy Phys, Beijing 100049, Peoples R China.
文章类型	Article
摘要	The Electro-optical sampling delay scanning technique can be used for electron beam bunch length measurement. A novel non-synchronous delay scanning technique based on the electro-optical sampling measurements is presented. Based on Beijing Free Electron Laser (BFEL), the electron beam bunch length was measured with the electro-optical sampling technique for the first time in China. The result shows that the electron beam bunch length at BFEL is about 5.6 +/- 1.2 ps.
关键词	electro-optical sampling measurement of electron beam bunch length non-synchronous delay scanning technique
学科领域	Physics
收录类别	SCI ; ADS
WOS类目	Physics, Nuclear ; Physics, Particles & Fields
WOS记录号	WOS:000274309200014
ADS Bibcode	2010ChPhC..34..227S
ADS URL	https://ui.adsabs.harvard.edu/abs/2010ChPhC..34..227S
ADS引文	https://ui.adsabs.harvard.edu/abs/2010ChPhC..34..227S/citations
引用统计	正在获取... 被引频次：0 [ADS]
文献类型	期刊论文
条目标识符	https://ir.ihep.ac.cn/handle/311005/227062
专题	院士多学科研究中心中国科学院高能物理研究所_所办公室
推荐引用方式 GB/T 7714	Sun DR,Xu JQ,Chen SY,et al. Electro-optical sampling non-synchronous delay scanning measurement of electron beam bunch length at BFEL[J]. CHINESE PHYSICS C,2010,34(2):#REF!.
APA	孙大睿,徐金强,陈森玉,Sun, DR,Xu, JQ,&Chen, SY.(2010).Electro-optical sampling non-synchronous delay scanning measurement of electron beam bunch length at BFEL.CHINESE PHYSICS C,34(2),#REF!.
MLA	孙大睿,et al."Electro-optical sampling non-synchronous delay scanning measurement of electron beam bunch length at BFEL".CHINESE PHYSICS C 34.2(2010):#REF!.