Knowledge Management System Of Institute of High Energy
| Electro-optical sampling non-synchronous delay scanning measurement of electron beam bunch length at BFEL | |
Sun DR(孙大睿) ; Xu JQ(徐金强); Chen SY(陈森玉); Sun, DR; Xu, JQ; Chen, SY
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| 2010 | |
| Source Publication | CHINESE PHYSICS C
 |
| Volume | 34Issue:2Pages:#REF! |
| Corresponding Author | Sun, DR (reprint author), CAS, Inst High Energy Phys, Beijing 100049, Peoples R China. |
| Subtype | Article |
| Abstract | The Electro-optical sampling delay scanning technique can be used for electron beam bunch length measurement. A novel non-synchronous delay scanning technique based on the electro-optical sampling measurements is presented. Based on Beijing Free Electron Laser (BFEL), the electron beam bunch length was measured with the electro-optical sampling technique for the first time in China. The result shows that the electron beam bunch length at BFEL is about 5.6 +/- 1.2 ps. |
| Keyword | electro-optical sampling measurement of electron beam bunch length non-synchronous delay scanning technique |
| Subject Area | Physics |
| Indexed By | SCI ; ADS |
| WOS Subject | Physics, Nuclear ; Physics, Particles & Fields |
| WOS ID | WOS:000274309200014 |
| ADS Bibcode | 2010ChPhC..34..227S |
| ADS URL | https://ui.adsabs.harvard.edu/abs/2010ChPhC..34..227S |
| ADS CITATIONS | https://ui.adsabs.harvard.edu/abs/2010ChPhC..34..227S/citations |
| Citation statistics |
Cited Times:0 [ADS]
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| Document Type | 期刊论文 |
| Identifier | http://ir.ihep.ac.cn/handle/311005/227062 |
| Collection | 院士 多学科研究中心 中国科学院高能物理研究所_所办公室 |
| Recommended Citation GB/T 7714 | Sun DR,Xu JQ,Chen SY,et al. Electro-optical sampling non-synchronous delay scanning measurement of electron beam bunch length at BFEL[J]. CHINESE PHYSICS C,2010,34(2):#REF!. |
| APA | 孙大睿,徐金强,陈森玉,Sun, DR,Xu, JQ,&Chen, SY.(2010).Electro-optical sampling non-synchronous delay scanning measurement of electron beam bunch length at BFEL.CHINESE PHYSICS C,34(2),#REF!. |
| MLA | 孙大睿,et al."Electro-optical sampling non-synchronous delay scanning measurement of electron beam bunch length at BFEL".CHINESE PHYSICS C 34.2(2010):#REF!. |
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