Experimental studies on FeS2 films prepared on Si(100) substrates by synchrotron radiation surface X-ray diffraction method

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	Experimental studies on FeS2 films prepared on Si(100) substrates by synchrotron radiation surface X-ray diffraction method
	Zhang, H; Wang, BY; Zhang, Z; Wang, P; Wei, L; Jia, QJ; Wang, YZ; Jia QJ(贾全杰)
	2005
发表期刊	HIGH ENERGY PHYSICS AND NUCLEAR PHYSICS-CHINESE EDITION
卷号	29 页码:#REF!
通讯作者	Zhang, H (reprint author), Chinese Acad Sci, Inst High Energy Phys, Key Lab Nucl Anal Tech, Beijing 100049, Peoples R China.
文章类型	Article
摘要	Both conventional X-ray diffraction (XRD) and synchrotron radiation surface X-ray diffraction methods were used to study FeS2 films prepared by magnetron sputtering on Si (100) and glass substrates for comparison. The results show that the preferred orientation of FeS2 along (311) direction, which might be due to the well-matched crystal lattice for FeS2 and Si (100), is mistaken. The peak at about 56 degrees with extremely strong intensity comes from the (311) crystal plane of the silicon substrate, other than the preferred orientation of FeS2. The conclusion is proved by both calculation and experimental measurements in present paper..
关键词	FeS2 synchrotron radiation surface X-ray diffraction semiconducting materials
学科领域	Physics
收录类别	SCI
WOS类目	Physics, Nuclear ; Physics, Particles & Fields
WOS记录号	WOS:000234206900009
引用统计	正在获取...
文献类型	期刊论文
条目标识符	https://ir.ihep.ac.cn/handle/311005/225632
专题	多学科研究中心
推荐引用方式 GB/T 7714	Zhang, H,Wang, BY,Zhang, Z,et al. Experimental studies on FeS2 films prepared on Si(100) substrates by synchrotron radiation surface X-ray diffraction method[J]. HIGH ENERGY PHYSICS AND NUCLEAR PHYSICS-CHINESE EDITION,2005,29:#REF!.
APA	Zhang, H.,Wang, BY.,Zhang, Z.,Wang, P.,Wei, L.,...&贾全杰.(2005).Experimental studies on FeS2 films prepared on Si(100) substrates by synchrotron radiation surface X-ray diffraction method.HIGH ENERGY PHYSICS AND NUCLEAR PHYSICS-CHINESE EDITION,29,#REF!.
MLA	Zhang, H,et al."Experimental studies on FeS2 films prepared on Si(100) substrates by synchrotron radiation surface X-ray diffraction method".HIGH ENERGY PHYSICS AND NUCLEAR PHYSICS-CHINESE EDITION 29(2005):#REF!.