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Experimental studies on FeS2 films prepared on Si(100) substrates by synchrotron radiation surface X-ray diffraction method
Zhang, H; Wang, BY; Zhang, Z; Wang, P; Wei, L; Jia, QJ; Wang, YZ; Jia QJ(贾全杰)
2005
发表期刊HIGH ENERGY PHYSICS AND NUCLEAR PHYSICS-CHINESE EDITION
卷号29页码:#REF!
通讯作者Zhang, H (reprint author), Chinese Acad Sci, Inst High Energy Phys, Key Lab Nucl Anal Tech, Beijing 100049, Peoples R China.
文章类型Article
摘要Both conventional X-ray diffraction (XRD) and synchrotron radiation surface X-ray diffraction methods were used to study FeS2 films prepared by magnetron sputtering on Si (100) and glass substrates for comparison. The results show that the preferred orientation of FeS2 along (311) direction, which might be due to the well-matched crystal lattice for FeS2 and Si (100), is mistaken. The peak at about 56 degrees with extremely strong intensity comes from the (311) crystal plane of the silicon substrate, other than the preferred orientation of FeS2. The conclusion is proved by both calculation and experimental measurements in present paper..
关键词FeS2 synchrotron radiation surface X-ray diffraction semiconducting materials
学科领域Physics
收录类别SCI
WOS类目Physics, Nuclear ; Physics, Particles & Fields
WOS记录号WOS:000234206900009
引用统计
被引频次:7[WOS]   [WOS记录]     [WOS相关记录]
文献类型期刊论文
条目标识符http://ir.ihep.ac.cn/handle/311005/225632
专题多学科研究中心
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GB/T 7714
Zhang, H,Wang, BY,Zhang, Z,et al. Experimental studies on FeS2 films prepared on Si(100) substrates by synchrotron radiation surface X-ray diffraction method[J]. HIGH ENERGY PHYSICS AND NUCLEAR PHYSICS-CHINESE EDITION,2005,29:#REF!.
APA Zhang, H.,Wang, BY.,Zhang, Z.,Wang, P.,Wei, L.,...&贾全杰.(2005).Experimental studies on FeS2 films prepared on Si(100) substrates by synchrotron radiation surface X-ray diffraction method.HIGH ENERGY PHYSICS AND NUCLEAR PHYSICS-CHINESE EDITION,29,#REF!.
MLA Zhang, H,et al."Experimental studies on FeS2 films prepared on Si(100) substrates by synchrotron radiation surface X-ray diffraction method".HIGH ENERGY PHYSICS AND NUCLEAR PHYSICS-CHINESE EDITION 29(2005):#REF!.
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