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Research on interface and fractal characteristics of PI/Al-2 O-3 Films by SAXS 期刊论文
ACTA PHYSICA SINICA, 2011, 卷号: 60, 期号: 5, 页码: 56101
Authors:  Liu, XX;  Yin, JH;  Cheng WD(程伟东);  Wu ZH(吴忠华);  Cheng, WD;  Bu, WB;  Fan, Y;  Wu, ZH
Adobe PDF(484Kb)  |  Favorite  |  View/Download:238/4  WOS cited times:[0]  |  Submit date:2016/06/29
SASX  nano-hybrid  polyimide  interface  
Small angle X-ray scattering study of the microstructure and interface characteristics of single crystal superalloys during creep process 期刊论文
ACTA PHYSICA SINICA, 2011, 卷号: 60, 期号: 1, 页码: 16102
Authors:  Sun, GA;  Chen, B;  Wu, ED;  Yan, GY;  Huang, CQ;  Li, WH;  Wu, ZH;  Liu, Y;  Wang, J;  Wu ZH(吴忠华)
Adobe PDF(876Kb)  |  Favorite  |  View/Download:70/0  WOS cited times:[0]  |  Submit date:2016/06/29
single crystal superalloy  secondary gamma ' precipitate  small angle X-ray scattering  microsturcture  
The evolution of crystalline structure in the preparation of PAN-based carbon fibers studied by whole powder pattern fitting 期刊论文
ACTA PHYSICA SINICA, 2011, 卷号: 60, 期号: 3, 页码: 36101
Authors:  Zhang, CH;  Sheng, Y;  Tian, H;  Xu, Y;  Lu, CX;  Wu, ZH;  Wu ZH(吴忠华)
Adobe PDF(831Kb)  |  Favorite  |  View/Download:73/0  WOS cited times:[0]  |  Submit date:2016/06/29
carbon fiber  crystalline structure  XRD  whole powder pattern fitting method  
SAXS and XRD studies on the microstructure of TiO2 nanoparticles 期刊论文
ACTA PHYSICA SINICA, 2008, 卷号: 57, 期号: 9, 页码: 5793-5799
Authors:  Chen ZJ(陈中军);  Wang W(王维);  Cai Q(蔡泉);  Chen X(陈兴);  Wu ZH(吴忠华);  Chen, ZJ;  Wang, W;  Cai, Q;  Chen, X;  Wu, ZH;  Li, RP;  Che, CQ;  Pan, W
Adobe PDF(283Kb)  |  Favorite  |  View/Download:82/0  WOS cited times:[0]  |  Submit date:2016/06/29
small angle X-ray scattering  X-ray diffraction  TiO2 nanoparticles  
Microscopic defects in Ti-Mo alloy hydrides studied by small-angle X-ray scattering 期刊论文
ACTA PHYSICA SINICA, 2008, 卷号: 57, 期号: 9, 页码: 5782-5787
Authors:  Du, XM;  Wu, ED;  Dong BZ(董宝中);  Wu ZH(吴忠华);  Dong, BZ;  Wu, ZH;  Yuan, XZ
Adobe PDF(441Kb)  |  Favorite  |  View/Download:81/0  WOS cited times:[0]  |  Submit date:2016/06/29
Ti-Mo alloy hydride  small-angle X-ray scattering  microscopic defects  
Studies on surface roughness and growth mechanisms of microcrystalline silicon films by grazing incidence X-ray reflectivity 期刊论文
ACTA PHYSICA SINICA, 2007, 卷号: 56, 期号: 4, 页码: 2422-2427
Authors:  Zhou, BQ;  Liu, FZ;  Zhu, MF;  Zhou, YQ;  Wu, ZH;  Chen, X;  Wu ZH(吴忠华);  Chen X(陈兴)
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grazing incidence X-ray reflectivity  microcrystalline silicon film  surface roughness  growth mechanism  
Sol-gel deposition of highly reflective multilayer coatings from PVP-ZrO2 hybrid systems 期刊论文
ACTA PHYSICA SINICA, 2006, 卷号: 55, 期号: 11, 页码: 6175-6184
Authors:  Liang, LP;  Zhang, L;  Xu, Y;  Zhang, B;  Wu, D;  Sun, YH;  Jiang, XD;  Wei, XF;  Li, ZH;  Wu, ZH;  Li ZH(李志宏);  Wu ZH(吴忠华)
Adobe PDF(470Kb)  |  Favorite  |  View/Download:108/0  WOS cited times:[0]  |  Submit date:2016/06/29
sol-gel  PVP-ZrO2  highly reflective coating  laser-induced damage  
Sol-gel processing of ZrO2 and polymer doped-ZrO2 monolayer reflective films with high laser damage threshold 期刊论文
ACTA PHYSICA SINICA, 2006, 卷号: 55, 期号: 8, 页码: 4371-4382
Authors:  Liang, LP;  Xu, Y;  Zhang, L;  Wu, D;  Sun, YH;  Li, ZH;  Wu, ZH;  Li ZH(李志宏);  Wu ZH(吴忠华)
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zirconium dioxide  sol-gel  reflective coating  laser damage  
Dependence of silica sol properties on synthesis situation studied by SAXS 期刊论文
ACTA PHYSICA SINICA, 2005, 卷号: 54, 期号: 6, 页码: 2814-2820
Authors:  Xu, Y;  Wu, D;  Sun, YH;  Li, ZH;  Dong, BZ;  Wu, ZH;  Li ZH(李志宏);  Dong BZ(董宝中);  Wu ZH(吴忠华)
Adobe PDF(308Kb)  |  Favorite  |  View/Download:81/1  WOS cited times:[0]  |  Submit date:2016/06/29
SAXS  silica  sol-gel  
Determination of fractal dimensions of silicon dioxide xerogel by means of gas-adsorption 期刊论文
ACTA PHYSICA SINICA, 2005, 卷号: 54, 期号: 1, 页码: #REF!
Authors:  Sheng, YG;  Xu, Y;  Li, ZH;  Wu, D;  Sun, YH;  Wu, ZH;  Li ZH(李志宏);  Wu ZH(吴忠华)
Adobe PDF(249Kb)  |  Favorite  |  View/Download:74/0  WOS cited times:[0]  |  Submit date:2016/04/12
fractal dimension  gas-adsorption  silicon dioxide  xerogel