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基于自适应光学的机载激光光束质量校正算法研究 期刊论文
航空制造技术, 2018, 卷号: 61, 期号: 16, 页码: P80-84,101
Authors:  王秋实;  张亦卓;  顾海栋
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Current status and trends of stitching interferometry in synchrotron radiation field 期刊论文
光学精密工程, 2016, 卷号: 24, 期号: 10, 页码: 2357-2369-
Authors:  Liu DX(刘丁枭);  Sheng WF(盛伟繁);  Wang QS(王秋实);  Li M(李明)
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博士论文-基于f-θ扫描原理的高精度面形检测装置的研究 学位论文
博士, 北京: 中国科学院大学, 2015
Authors:  王秋实
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长程面形仪  应用光学  光学测量  面形检测  光学系统设计  误差分析  探测  
Theoretical analysis on optical parallelism of pentaprism 期刊论文
光子学报, 2015, 卷号: 44, 期号: 5, 页码: 523006
Authors:  Wang QS(王秋实);  Li M(李明);  Liao KL(廖可梁);  Yang FG(杨福桂);  Sheng WF(盛伟繁);  Wang;  Qiu-Shi;  Li;  Ming;  Liao;  Ke-Liang;  Yang;  Fu-Gui;  Sheng;  Wei-Fan
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Analytical expressions  Coordinates transformation  High-precision optical surfaces  Laser interferometer  Matrix optics  Pentaprism  System calibration  Tolerance analysis  
Laser flat-field system based on light scattering in nano-particle solution 期刊论文
光学精密工程, 2015, 卷号: 23, 期号: 5, 页码: 1213-1220
Authors:  Wang QS(王秋实);  Yang FG(杨福桂);  Liu DX(刘丁枭);  Sheng WF(盛伟繁);  Li M(李明);  Wang;  Qiu-Shi;  Yang;  Fu-Gui;  Liu;  Ding-Xiao;  Sheng;  Wei-Fan;  Li;  Ming
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Backscattering light  CCD arrays  Long trace profiler  Nanoparticle solutions  Non-uniform  Polytetrafluoroethylene (PTFE)  Precision instrument  Structure parameter  
Periodic Co/C, Cr/C, and CoCr/C soft X-ray multilayers prepared by N reactive sputtering 期刊论文
Proceedings of SPIE, 2015, 卷号: 9510, 页码: 95100X
Authors:  Wen;  Mingwu;  Jiang;  Li;  Zhang;  Zhong;  Huang;  Qiushi;  Wang;  Zhanshan;  Wang;  Hongchang;  Cui;  Mingqi;  Yi;  Rongqing;  Cui MQ(崔明启)
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Soft X-ray  Polarization  Cr/C multilayer  Co/C multilayer  CoCr/C multilayer  Nitridation  
Light source system for high-precision flat-field correction and the calibration of an array detector 期刊论文
CHINESE OPTICS LETTERS, 2015, 卷号: 13, 期号: 4, 页码: 40402
Authors:  Yang FG(杨福桂);  Wang QS(王秋实);  Li M(李明);  Yang, FG;  Wang, QS;  Li, M
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一种高精度长程光学表面面形检测仪 专利
专利类型: 审中, 专利号: CN104019762A, 申请日期: 2014-06-10, 公开日期: 2014-09-03
Inventors:  李明;  杨福桂;  王秋实;  盛伟繁;  刘鹏
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测量颗粒粒径分布的方法及装置 专利
专利类型: 审中, 专利号: CN103983546A, 申请日期: 2014-03-31, 公开日期: 2014-08-13
Inventors:  杨福桂;  王秋实;  李明;  盛伟繁
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Analysis of tilted multilayer Laue lens with stochastic layer thickness error 期刊论文
OPTICS COMMUNICATIONS, 2014, 卷号: 325, 页码: 111-115
Authors:  Liao KL(廖可梁);  Hong YL(洪友丽);  Wang QS(王秋实);  Chang GC(常广才);  盛伟繁;Liao, K;  Hong, Y;  Wang, Q;  Chang, G;  Sheng, W
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Multilayer Laue lens  Nano-focusing  X-ray optics