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Deep neural networks for energy and position reconstruction in EXO-200 期刊论文
JOURNAL OF INSTRUMENTATION, 2018, 卷号: 13, 页码: P08023
Authors:  Delaquis, S;  Jewell, MJ;  Ostrovskiy, I;  Weber, M;  Ziegler, T;  Dalmasson, J;  Kaufman, LJ;  Richards, T;  Albert, JB;  Anton, G;  Badhrees, I;  Barbeau, PS;  Bayerlein, R;  Beck, D;  Belov, V;  Breidenbach, M;  Brunner, T;  Cao, GF;  Cen, WR;  Chambers, C;  Clevel;  , B;  Coon, M;  Craycraft, A;  Cree, W;  Daniels, T;  Danilov, M;  Daugherty, SJ;  Daughhetee, J;  Davis, J;  Mesrobian-Kabakian, AD;  DeVoe, R;  Dilling, J;  Dolgolenko, A;  Dolinski, MJ;  Fairbank, W;  Farine, J;  Feyzbakhsh, S;  Fierlinger, P;  Fudenberg, D;  Gornea, R;  Gratta, G;  Hall, C;  Hansen, EV;  Harris, D;  Hoessl, J;  Hufschmidt, P;  Hughes, M;  Iverson, A;  Jamil, A;  Johnson, A;  Karelin, A;  Koffas, T;  Kravitz, S;  Krucken, R;  Kuchenkov, A;  Kumar, KS;  Lan, Y;  Leonard, DS;  Li, GS;  Li, S;  Licciardi, C;  Lin, YH;  MacLellan, R;  Michel, T;  Mong, B;  Moore, D;  Murray, K;  Njoya, O;  Odian, A;  Piepke, A;  Pocar, A;  Retiere, F;  Robinson, AL;  Rowson, PC;  Schmidt, S;  Schubert, A;  Sinclair, D;  Soma, AK;  Stekhanov, V;  Tarka, M;  Todd, J;  Tolba, T;  Veeraraghavan, V;  Vuilleumier, JL;  Wagenpfeil, M;  Waite, A;  Watkins, J;  Wen, LJ;  Wichoski, U;  Wrede, G;  Xia, Q;  Yang, L;  Yen, YR;  Zeldovich, OY;  Cao GF(曹国富);  Cen WR(岑吴镕);  Wen LJ(温良剑)
Adobe PDF(4057Kb)  |  Favorite  |  View/Download：163/1  WOS cited times:[0]  INSPIRE cited times:[20]  ADS cited times:[35]  |  Submit date：2019/09/24
Analysis and statistical methods  Double-beta decay detectors  Pattern recognition  cluster finding  calibration and fitting methods  Time projection chambers  
VUV-Sensitive Silicon Photomultipliers for Xenon Scintillation Light Detection in nEXO 期刊论文
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2018, 卷号: 65, 期号: 11, 页码: 2823-2833
Authors:  Jamil, A.;  Ziegler, T.;  Hufschmidt, P.;  Li, G.;  Lupin-Jimenez, L.;  Michel, T.;  Ostrovskiy, I.;  Retière, F.;  Schneider, J.;  Wagenpfeil, M.;  Alamre, A.;  Albert, J.B.;  Anton, G.;  Arnquist, I.J.;  Badhrees, I.;  Barbeau, P.S.;  Beck, D.;  Belov, V.;  Bhatta, T.;  Bourque, F.;  Brodsky, J.P.;  Brown, E.;  Brunner, T.;  Burenkov, A.;  Cao, G.F.;  Cao, L.;  Cen, W.R.;  Chambers, C.;  Charlebois, S.A.;  Chiu, M.;  Clevel;  , B.;  Coon, M.;  Côté, M.;  Craycraft, A.;  Cree, W.;  Dalmasson, J.;  Daniels, T.;  Darroch, L.;  Daugherty, S.J.;  Daughhetee, J.;  Delaquis, S.;  Mesrobian-Kabakian, A. Der;  DeVoe, R.;  Dilling, J.;  Ding, Y.Y.;  Dolinski, M.J.;  Dragone, A.;  Echevers, J.;  Fabris, L.;  Fairbank, D.;  Fairbank, W.;  Farine, J.;  Feyzbakhsh, S.;  Fontaine, R.;  Fudenberg, D.;  Gallina, G.;  Giacomini, G.;  Gornea, R.;  Gratta, G.;  Hansen, E.V.;  Harris, D.;  Hasan, M.;  Heffner, M.;  Hößl, J.;  Hoppe, E.W.;  House, A.;  Hughes, M.;  Ito, Y.;  Iverson, A.;  Jessiman, C.;  Jewell, M.J.;  Jiang, X.S.;  Karelin, A.;  Kaufman, L.J.;  Koffas, T.;  Kravitz, S.;  Krücken, R.;  Kuchenkov, A.;  Kumar, K.S.;  Lan, Y.;  Larson, A.;  Leonard, D.S.;  Li, S.;  Li, Z.;  Licciardi, C.;  Lin, Y.H.;  Lv, P.;  MacLellan, R.;  Mong, B.;  Moore, D.C.;  Murray, K.;  Newby, R.J.;  Ning, Z.;  Njoya, O.;  Nolet, F.;  Nusair, O.;  Odgers, K.;  Odian, A.;  Oriunno, M.;  Orrell, J.L.;  Ortega, G.S.;  Overman, C.T.;  Parent, S.;  Piepke, A.;  Pocar, A.;  Pratte, J.-F.;  Qiu, D.;  Radeka, V.;  Raguzin, E.;  Rao, T.;  Rescia, S.;  Robinson, A.;  Rossignol, T.;  Rowson, P.C.;  Roy, N.;  Saldanha, R.;  Sangiorgio, S.;  Schmidt, S.;  Schubert, A.;  Sinclair, D.;  Skarpaas, K.;  Soma, A.K.;  St-Hilaire, G.;  Stekhanov, V.;  Stiegler, T.;  Sun, X.L.;  Tarka, M.;  Todd, J.;  Tolba, T.;  Totev, T.I.;  Tsang, R.;  Tsang, T.;  Vachon, F.;  Veenstra, B.;  Veeraraghavan, V.;  Visser, G.;  Vuilleumier, J.-L.;  Wang, Q.;  Watkins, J.;  Weber, M.;  Wei, W.;  Wen, L.J.;  Wichoski, U.;  Wrede, G.;  Wu, S.X.;  Wu, W.H.;  Xia, Q.;  Yang, L.;  Yen, Y.-R.;  Zeldovich, O.;  Zhang, X.;  Zhao, J.;  Zhou, Y.;  Jamil, A.;  Ziegler, T.;  Hufschmidt, P.;  Li, G.;  Lupin-Jimenez, L.;  Michel, T.;  Ostrovskiy, I.;  Retière, F.;  Schneider, J.;  Wagenpfeil, M.;  Alamre, A.;  Albert, J. B.;  Anton, G.;  Arnquist, I. J.;  Badhrees, I.;  Barbeau, P. S.;  Beck, D.;  Belov, V.;  Bhatta, T.;  Bourque, F.;  Brodsky, J. P.;  Brown, E.;  Brunner, T.;  Burenkov, A.;  Cao, G. F.;  Cao, L.;  Cen, W. R.;  Chambers, C.;  Charlebois, S. A.;  Chiu, M.;  Clevel;  , B.;  Coon, M.;  Côté, M.;  Craycraft, A.;  Cree, W.;  Dalmasson, J.;  Daniels, T.;  Darroch, L.;  Daugherty, S. J.;  Daughhetee, J.;  Delaquis, S.;  Mesrobian-Kabakian, A. D.;  DeVoe, R.;  Dilling, J.;  Ding, Y. Y.;  Dolinski, M. J.;  Dragone, A.;  Echevers, J.;  Fabris, L.;  Fairbank, D.;  Fairbank, W.;  Farine, J.;  Feyzbakhsh, S.;  Fontaine, R.;  Fudenberg, D.;  Gallina, G.;  Giacomini, G.;  Gornea, R.;  Gratta, G.;  Hansen, E. V.;  Harris, D.;  Hasan, M.;  Heffner, M.;  Hößl, J.;  Hoppe, E. W.;  House, A.;  Hughes, M.;  Ito, Y.;  Iverson, A.;  Jessiman, C.;  Jewell, M. J.;  Jiang, X. S.;  Karelin, A.;  Kaufman, L. J.;  Koffas, T.;  Kravitz, S.;  Krücken, R.;  Kuchenkov, A.;  Kumar, K. S.;  Lan, Y.;  Larson, A.;  Leonard, D. S.;  Li, S.;  Li, Z.;  Licciardi, C.;  Lin, Y. H.;  Lv, P.;  MacLellan, R.;  Mong, B.;  Moore, D. C.;  Murray, K.;  Newby, R. J.;  Ning, Z.;  Njoya, O.;  Nolet, F.;  Nusair, O.;  Odgers, K.;  Odian, A.;  Oriunno, M.;  Orrell, J. L.;  Ortega, G. S.;  Overman, C. T.;  Parent, S.;  Piepke, A.;  Pocar, A.;  Pratte, J.;  Qiu, D.;  Radeka, V.;  Raguzin, E.;  Rao, T.;  Rescia, S.;  Robinson, A.;  Rossignol, T.;  Rowson, P. C.;  Roy, N.;  Saldanha, R.;  Sangiorgio, S.;  Schmidt, S.;  Schubert, A.;  Sinclair, D.;  Skarpaas, K.;  Soma, A. K.;  St-Hilaire, G.;  Stekhanov, V.;  Stiegler, T.;  Sun, X. L.;  Tarka, M.;  Todd, J.;  Tolba, T.;  Totev, T. I.;  Tsang, R.;  Tsang, T.;  Vachon, F.;  Veenstra, B.;  Veeraraghavan, V.;  Visser, G.;  Vuilleumier, J.;  Wang, Q.;  Watkins, J.;  Weber, M.;  Wei, W.;  Wen, L. J.;  Wichoski, U.;  Wrede, G.;  Wu, S. X.;  Wu, W. H.;  Xia, Q.;  Yang, L.;  Yen, Y.;  Zeldovich, O.;  Zhang, X.;  Zhao, J.;  Zhou, Y.;  Jamil, A;  Ziegler, T;  Hufschmidt, P;  Li, G;  Lupin-Jimenez, L;  Michel, T;  Ostrovskiy, I;  Retiere, F;  Schneider, J;  Wagenpfeil, M;  Alamre, A;  Albert, JB;  Anton, G;  Arnquist, IJ;  Badhrees, I;  Barbeau, PS;  Beck, D;  Belov, V;  Bhatta, T;  Bourque, E;  Brodsky, JP;  Brown, E;  Brunner, T;  Burenkov, A;  Cao, GF;  Cao, L;  Cen, WR;  Chambers, C;  Charlebois, SA;  Chiu, M;  Clevel;  , B;  Coon, M;  Cote, M;  Craycraft, A;  Cree, W;  Dalmasson, J;  Daniels, T;  Darroch, L;  Daugherty, SJ;  Daughhetee, J;  Delaquis, S;  Mesrobian-Kabakian, AD;  DeVoe, R;  Dilling, J;  Ding, YY;  Dolinski, MJ;  Dragone, A;  Echevers, J;  Fabris, L;  Fairbank, D;  Fairbank, W;  Farine, J;  Feyzbakhsh, S;  Fontaine, R;  Fudenberg, D;  Gallina, G;  Giacomini, G;  Gornea, R;  Grata, G;  Hansen, EV;  Harris, D;  Hasan, M;  Heffner, M;  Hoessl, J;  Hoppe, EW;  House, A;  Hughes, M;  Ito, Y;  Iverson, A;  Jessiman, C;  Jewell, MJ;  Jiang, XS;  Karelin, A;  Kaufman, LJ;  Koffas, T;  Kravitz, S;  Krucken, R;  Kuchenkov, A;  Kumar, KS;  Lan, Y;  Larson, A;  Leonard, DS;  Li, S;  Li, Z;  Licciardi, C;  Lin, YH;  Lv, P;  MacLellan, R;  Mong, B;  Moore, DC;  Murray, K;  Newby, RJ;  Ning, Z;  Njoya, O;  Nolet, F;  Nusair, O;  Odgers, K;  Odian, A;  Oriunno, M;  Orrell, JL;  Ortega, GS;  Overman, CT;  Parent, S;  Piepke, A;  Pocar, A;  Pratte, JE;  Qiu, D;  Radeka, V;  Raguzin, E;  Rao, T;  Rescia, S;  Robinson, A;  Rossignol, T;  Rowson, PC;  Roy, N;  Saldanha, R;  Sangiorgio, S;  Schmidt, S;  Schubert, A;  Sinclair, D;  Skarpaas, K;  Soma, AK;  St-Hilaire, G;  Stekhanov, V;  Stiegler, T;  Sun, XL;  Tarka, M;  Todd, J;  Tolba, T;  Totev, TI;  Tsang, R;  Tsang, T;  Vachon, F;  Veenstra, B;  Veeraraghavan, V;  Visser, G;  Vuilleumier, JL;  Wang, Q;  Watkins, J;  Weber, M;  Wei, W;  Wen, LJ;  Wichoski, U;  Wrede, G;  Wu, SX;  Wu, WH;  Xia, Q;  Yang, L;  Yen, YR;  Zeldovich, O;  Zhang, X;  Zhao, J;  Zhou, Y
Adobe PDF(2482Kb)  |  Favorite  |  View/Download：139/0  WOS cited times:[24]  INSPIRE cited times:[18]  ADS cited times:[20]  |  Submit date：2019/10/11
nEXO  photodetectors  silicon photomultiplier  vacuum ultraviolet (VUV) light  xenon detectors  
Trace radioactive impurities in final construction materials for EXO-200 期刊论文
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2017, 卷号: 871, 页码: 169-179
Authors:  Leonard, DS;  Auty, DJ;  Didberidze, T;  Gornea, R;  Grinberg, P;  MacLellan, R;  Methven, B;  Piepke, A;  Vuilleumier, JL;  Albert, JB;  Anton, G;  Badhrees, I;  Barbeau, PS;  Bayerlein, R;  Beck, D;  Belov, V;  Breidenbach, M;  Brunner, T;  Cao, GF;  Cen, WR;  Chambers, C;  Cleveland, B;  Coon, M;  Craycraft, A;  Cree, W;  Daniels, T;  Danilov, M;  Daugherty, SJ;  Daughhetee, J;  Davis, J;  Delaquis, S;  Mesrobian-Kabakian, AD;  DeVoe, R;  Dilling, J;  Dolgolenko, A;  Dolinski, MJ;  Fairbank, W;  Farine, J;  Feyzbakhsh, S;  Fierlinger, P;  Fudenberg, D;  Graham, K;  Gratta, G;  Hall, C;  Herrin, S;  Hoessl, J;  Hufschmidt, P;  Hughes, M;  Jamil, A;  Jewell, MJ;  Johnson, A;  Johnston, S;  Karelin, A;  Kaufman, LJ;  Koffas, T;  Kravitz, S;  Krcken, R;  Kuchenkov, A;  Kumar, KS;  Lan, Y;  LePort, F;  Li, S;  Licciardi, C;  Lin, YH;  Mackay, D;  Marino, MG;  Michel, T;  Mong, B;  Moore, D;  Murray, K;  Neilson, R;  Nelson, R;  Njoya, O;  Odian, A;  Ostrovskiy, I;  Pocar, A;  Pushkin, K;  RetiSre, F;  Rowson, PC;  Russell, JJ;  Schubert, A;  Sinclair, D;  Smith, E;  Stekhanov, V;  Tarka, M;  Tolba, T;  Tsang, R;  Wagenpfeil, M;  Waite, A;  Walton, J;  Walton, T;  Wamba, K;  Weber, M;  Wen, LJ;  Wichoski, U;  Wodin, J;  Yang, L;  Yen, YR;  Zeldovich, OY;  Zettlemoyer, J;  Ziegler, T;  Cao GF(曹国富);  Cen WR(岑吴镕);  T.tolba;  Wen LJ(温良剑)
Adobe PDF(2548Kb)  |  Favorite  |  View/Download：166/0  WOS cited times:[0]  ADS cited times:[26]  |  Submit date：2019/08/27
Radiopurity  Ultra-trace analysis  Neutron activation analysis  Mass spectrometry  Mass spectroscopy  Germanium counting  Alpha counting  Low background  Double beta decay  EXO  EXO-200  
An RF-only ion-funnel for extraction from high-pressure gases 期刊论文
INTERNATIONAL JOURNAL OF MASS SPECTROMETRY, 2015, 卷号: 379, 期号: SI, 页码: 110-120
Authors:  Brunner, T;  Fudenberg, D;  Varentsov, V;  Sabourov, A;  Gratta, G;  Dilling, J;  DeVoe, R;  Sinclair, D;  Fairbank, W;  Albert, JB;  Auty, DJ;  Barbeau, PS;  Beck, D;  Benitez-Medina, C;  Breidenbach, M;  Cao, GF;  Chambers, C;  Cleveland, B;  Coon, M;  Craycraft, A;  Daniels, T;  Daugherty, SJ;  Didberidze, T;  Dolinski, MJ;  Dunford, M;  Fabris, L;  Farine, J;  Feldmeier, W;  Fierlinger, P;  Gornea, R;  Graham, K;  Heffner, M;  Hughes, M;  Jewell, M;  Jiang, XS;  Johnson, TN;  Johnston, S;  Karelin, A;  Kaufman, LJ;  Killick, R;  Koffas, T;  Kravitz, S;  Krucken, R;  Kuchenkov, A;  Kurnar, KS;  Leonard, DS;  Leonard, F;  Licciardi, C;  Lin, YH;  Ling, J;  MacLellan, R;  Marino, MG;  Mong, B;  Moore, D;  Odian, A;  Ostrovskiy, I;  Ouellet, C;  Piepke, A;  Pocar, A;  Retiere, F;  Rowson, PC;  Rozo, MP;  Schubert, A;  Smith, E;  Stekhanov, V;  Tarka, M;  Tolba, T;  Tosi, D;  Twelker, K;  Vuilleumier, JL;  Walton, J;  Walton, T;  Weber, M;  Wen, LJ;  Wichoski, U;  Yang, L;  Yen, YR;  Jiang XS(江晓山);  Wen LJ(温良剑)
Adobe PDF(3293Kb)  |  Favorite  |  View/Download：289/1  WOS cited times:[0]  ADS cited times:[26]  |  Submit date：2016/04/18
RF-funnel  Gas dynamic and ion trajectory  simulations  Gas jet  Xe-136 double-beta decay  Ba tagging  Ion transport  
Inhomogeneous Flux Penetration in Niobium Sheet Sampled Across the Cavity Production Route 会议论文
Proceedings of the 12th International Workshop on RF Supperconductivity, New York, 2005
Authors:  A.A.Polyanskii;  A.Gurevich;  M.C.Jewell;  D.C.Larbalestier;  P.J.Lee;  A.A.Squitieri
Adobe PDF(1043Kb)  |  Favorite  |  View/Download：70/3  |  Submit date：2017/06/16