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Electronic structure of La2O3/Si interface by in situ photoemission spectroscopy 期刊论文
MATERIALS LETTERS, 2017, 卷号: 191, 页码: 97-100
Authors:  Ablat, A;  Mamat, M;  Ghupur, Y;  Aimidula, A;  Wu, R;  Baqi, MA;  Gholam, T;  Wang, JO;  Qian, HJ;  Wu, R;  Ibrahim, K;  Wang JO(王嘉鸥);  Qian HJ(钱海杰);  Wu R(吴蕊);  Kui RX(奎热西)
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La2O3  High-k  Structural  X-ray techniques  Interface