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Deep neural networks for energy and position reconstruction in EXO-200 期刊论文
JOURNAL OF INSTRUMENTATION, 2018, 卷号: 13, 页码: P08023
Authors:  Delaquis, S;  Jewell, MJ;  Ostrovskiy, I;  Weber, M;  Ziegler, T;  Dalmasson, J;  Kaufman, LJ;  Richards, T;  Albert, JB;  Anton, G;  Badhrees, I;  Barbeau, PS;  Bayerlein, R;  Beck, D;  Belov, V;  Breidenbach, M;  Brunner, T;  Cao, GF;  Cen, WR;  Chambers, C;  Clevel;  , B;  Coon, M;  Craycraft, A;  Cree, W;  Daniels, T;  Danilov, M;  Daugherty, SJ;  Daughhetee, J;  Davis, J;  Mesrobian-Kabakian, AD;  DeVoe, R;  Dilling, J;  Dolgolenko, A;  Dolinski, MJ;  Fairbank, W;  Farine, J;  Feyzbakhsh, S;  Fierlinger, P;  Fudenberg, D;  Gornea, R;  Gratta, G;  Hall, C;  Hansen, EV;  Harris, D;  Hoessl, J;  Hufschmidt, P;  Hughes, M;  Iverson, A;  Jamil, A;  Johnson, A;  Karelin, A;  Koffas, T;  Kravitz, S;  Krucken, R;  Kuchenkov, A;  Kumar, KS;  Lan, Y;  Leonard, DS;  Li, GS;  Li, S;  Licciardi, C;  Lin, YH;  MacLellan, R;  Michel, T;  Mong, B;  Moore, D;  Murray, K;  Njoya, O;  Odian, A;  Piepke, A;  Pocar, A;  Retiere, F;  Robinson, AL;  Rowson, PC;  Schmidt, S;  Schubert, A;  Sinclair, D;  Soma, AK;  Stekhanov, V;  Tarka, M;  Todd, J;  Tolba, T;  Veeraraghavan, V;  Vuilleumier, JL;  Wagenpfeil, M;  Waite, A;  Watkins, J;  Wen, LJ;  Wichoski, U;  Wrede, G;  Xia, Q;  Yang, L;  Yen, YR;  Zeldovich, OY;  Cao GF(曹国富);  Cen WR(岑吴镕);  Wen LJ(温良剑)
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Analysis and statistical methods  Double-beta decay detectors  Pattern recognition  cluster finding  calibration and fitting methods  Time projection chambers  
Measurement of the tau Michel parameters (eta)over-bar and xi kappa in the radiative leptonic decay tau(-) -> l(-)nu(tau)(nu)over-bar(l)gamma 期刊论文
PROGRESS OF THEORETICAL AND EXPERIMENTAL PHYSICS, 2018, 期号: 2, 页码: 023C01
Authors:  Shimizu, N;  Aihara, H;  Epifanov, D;  Adachi, I;  Al Said, S;  Asner, DM;  Aulchenko, V;  Aushev, T;  Ayad, R;  Babu, V;  Badhrees, I;  Bakich, AM;  Bansal, V;  Barberio, E;  Bhardwaj, V;  Bhuyan, B;  Biswal, J;  Bobrov, A;  Bozek, A;  Bracko, M;  Browder, TE;  Cervenkov, D;  Chang, MC;  Chang, P;  Chekelian, V;  Chen, A;  Cheon, BG;  Chilikin, K;  Cho, K;  Choi, SK;  Choi, Y;  Cinabro, D;  Czank, T;  Dash, N;  Di Carlo, S;  Dolezal, Z;  Dutta, D;  Eidelman, S;  Fast, JE;  Ferber, T;  Fulsom, BG;  Garg, R;  Gaur, V;  Gabyshev, N;  Garmash, A;  Gelb, M;  Goldenzweig, P;  Greenwald, D;  Guido, E;  Haba, J;  Hayasaka, K;  Hayashii, H;  Hedges, MT;  Hirose, S;  Hou, WS;  Iijima, T;  Inami, K;  Inguglia, G;  Ishikawa, A;  Itoh, R;  Iwasaki, M;  Jaegle, I;  Jeon, HB;  Jia, S;  Jin, Y;  Joo, KK;  Julius, T;  Kang, KH;  Karyan, G;  Kawasaki, T;  Kiesling, C;  Kim, DY;  Kim, JB;  Kim, SH;  Kim, YJ;  Kinoshita, K;  Kodys, P;  Korpar, S;  Kotchetkov, D;  Krizan, P;  Kroeger, R;  Krokovny, P;  Kulasiri, R;  Kuzmin, A;  Kwon, YJ;  Lange, JS;  Lee, IS;  Li, LK;  Li, Y;  Gioi, LL;  Libby, J;  Liventsev, D;  Masuda, M;  Merola, M;  Miyabayashi, K;  Miyata, H;  Mohanty, GB;  Moon, HK;  Mori, T;  Mussa, R;  Nakano, E;  Nakao, M;  Nanut, T;  Nath, KJ;  Natkaniec, Z;  Nayak, M;  Niiyama, M;  Nisar, NK;  Nishida, S;  Ogawa, S;  Okuno, S;  Ono, H;  Pakhlova, G;  Pal, B;  Park, CW;  Park, H;  Paul, S;  Pedlar, TK;  Pestotnik, R;  Piilonen, LE;  Popov, V;  Ritter, M;  Rostomyan, A;  Sakai, Y;  Salehi, M;  S;  ilya, S;  Sato, Y;  Savinov, V;  Schneider, O;  Schnell, G;  Schw;  a, C;  Seino, Y;  Senyo, K;  Sevior, ME;  Shebalin, V;  Shibata, TA;  Shiu, JG;  Shwartz, B;  Sokolov, A;  Solovieva, E;  Staric, M;  Strube, JF;  Sumisawa, K;  Sumiyoshi, T;  Tamponi, U;  Tanida, K;  Tenchini, F;  Trabelsi, K;  Uchida, M;  Uglov, T;  Unno, Y;  Uno, S;  Usov, Y;  Van Hulse, C;  Varner, G;  Vorobyev, V;  Vossen, A;  Wang, CH;  Wang, MZ;  Wang, P;  Watanabe, M;  Widmann, E;  Won, E;  Yamashita, Y;  Ye, H;  Yuan, CZ;  Zhang, ZP;  Zhilich, V;  Zhukova, V;  Zhulanov, V;  Zupanc, A;  Li LK(李龙科);  王平(实);  Yuan ZZ(苑长征)
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VUV-Sensitive Silicon Photomultipliers for Xenon Scintillation Light Detection in nEXO 期刊论文
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2018, 卷号: 65, 期号: 11, 页码: 2823-2833
Authors:  Jamil, A.;  Ziegler, T.;  Hufschmidt, P.;  Li, G.;  Lupin-Jimenez, L.;  Michel, T.;  Ostrovskiy, I.;  Retière, F.;  Schneider, J.;  Wagenpfeil, M.;  Alamre, A.;  Albert, J.B.;  Anton, G.;  Arnquist, I.J.;  Badhrees, I.;  Barbeau, P.S.;  Beck, D.;  Belov, V.;  Bhatta, T.;  Bourque, F.;  Brodsky, J.P.;  Brown, E.;  Brunner, T.;  Burenkov, A.;  Cao, G.F.;  Cao, L.;  Cen, W.R.;  Chambers, C.;  Charlebois, S.A.;  Chiu, M.;  Clevel;  , B.;  Coon, M.;  Côté, M.;  Craycraft, A.;  Cree, W.;  Dalmasson, J.;  Daniels, T.;  Darroch, L.;  Daugherty, S.J.;  Daughhetee, J.;  Delaquis, S.;  Mesrobian-Kabakian, A. Der;  DeVoe, R.;  Dilling, J.;  Ding, Y.Y.;  Dolinski, M.J.;  Dragone, A.;  Echevers, J.;  Fabris, L.;  Fairbank, D.;  Fairbank, W.;  Farine, J.;  Feyzbakhsh, S.;  Fontaine, R.;  Fudenberg, D.;  Gallina, G.;  Giacomini, G.;  Gornea, R.;  Gratta, G.;  Hansen, E.V.;  Harris, D.;  Hasan, M.;  Heffner, M.;  Hößl, J.;  Hoppe, E.W.;  House, A.;  Hughes, M.;  Ito, Y.;  Iverson, A.;  Jessiman, C.;  Jewell, M.J.;  Jiang, X.S.;  Karelin, A.;  Kaufman, L.J.;  Koffas, T.;  Kravitz, S.;  Krücken, R.;  Kuchenkov, A.;  Kumar, K.S.;  Lan, Y.;  Larson, A.;  Leonard, D.S.;  Li, S.;  Li, Z.;  Licciardi, C.;  Lin, Y.H.;  Lv, P.;  MacLellan, R.;  Mong, B.;  Moore, D.C.;  Murray, K.;  Newby, R.J.;  Ning, Z.;  Njoya, O.;  Nolet, F.;  Nusair, O.;  Odgers, K.;  Odian, A.;  Oriunno, M.;  Orrell, J.L.;  Ortega, G.S.;  Overman, C.T.;  Parent, S.;  Piepke, A.;  Pocar, A.;  Pratte, J.-F.;  Qiu, D.;  Radeka, V.;  Raguzin, E.;  Rao, T.;  Rescia, S.;  Robinson, A.;  Rossignol, T.;  Rowson, P.C.;  Roy, N.;  Saldanha, R.;  Sangiorgio, S.;  Schmidt, S.;  Schubert, A.;  Sinclair, D.;  Skarpaas, K.;  Soma, A.K.;  St-Hilaire, G.;  Stekhanov, V.;  Stiegler, T.;  Sun, X.L.;  Tarka, M.;  Todd, J.;  Tolba, T.;  Totev, T.I.;  Tsang, R.;  Tsang, T.;  Vachon, F.;  Veenstra, B.;  Veeraraghavan, V.;  Visser, G.;  Vuilleumier, J.-L.;  Wang, Q.;  Watkins, J.;  Weber, M.;  Wei, W.;  Wen, L.J.;  Wichoski, U.;  Wrede, G.;  Wu, S.X.;  Wu, W.H.;  Xia, Q.;  Yang, L.;  Yen, Y.-R.;  Zeldovich, O.;  Zhang, X.;  Zhao, J.;  Zhou, Y.;  Jamil, A.;  Ziegler, T.;  Hufschmidt, P.;  Li, G.;  Lupin-Jimenez, L.;  Michel, T.;  Ostrovskiy, I.;  Retière, F.;  Schneider, J.;  Wagenpfeil, M.;  Alamre, A.;  Albert, J. B.;  Anton, G.;  Arnquist, I. J.;  Badhrees, I.;  Barbeau, P. S.;  Beck, D.;  Belov, V.;  Bhatta, T.;  Bourque, F.;  Brodsky, J. P.;  Brown, E.;  Brunner, T.;  Burenkov, A.;  Cao, G. F.;  Cao, L.;  Cen, W. R.;  Chambers, C.;  Charlebois, S. A.;  Chiu, M.;  Clevel;  , B.;  Coon, M.;  Côté, M.;  Craycraft, A.;  Cree, W.;  Dalmasson, J.;  Daniels, T.;  Darroch, L.;  Daugherty, S. J.;  Daughhetee, J.;  Delaquis, S.;  Mesrobian-Kabakian, A. D.;  DeVoe, R.;  Dilling, J.;  Ding, Y. Y.;  Dolinski, M. J.;  Dragone, A.;  Echevers, J.;  Fabris, L.;  Fairbank, D.;  Fairbank, W.;  Farine, J.;  Feyzbakhsh, S.;  Fontaine, R.;  Fudenberg, D.;  Gallina, G.;  Giacomini, G.;  Gornea, R.;  Gratta, G.;  Hansen, E. V.;  Harris, D.;  Hasan, M.;  Heffner, M.;  Hößl, J.;  Hoppe, E. W.;  House, A.;  Hughes, M.;  Ito, Y.;  Iverson, A.;  Jessiman, C.;  Jewell, M. J.;  Jiang, X. S.;  Karelin, A.;  Kaufman, L. J.;  Koffas, T.;  Kravitz, S.;  Krücken, R.;  Kuchenkov, A.;  Kumar, K. S.;  Lan, Y.;  Larson, A.;  Leonard, D. S.;  Li, S.;  Li, Z.;  Licciardi, C.;  Lin, Y. H.;  Lv, P.;  MacLellan, R.;  Mong, B.;  Moore, D. C.;  Murray, K.;  Newby, R. J.;  Ning, Z.;  Njoya, O.;  Nolet, F.;  Nusair, O.;  Odgers, K.;  Odian, A.;  Oriunno, M.;  Orrell, J. L.;  Ortega, G. S.;  Overman, C. T.;  Parent, S.;  Piepke, A.;  Pocar, A.;  Pratte, J.;  Qiu, D.;  Radeka, V.;  Raguzin, E.;  Rao, T.;  Rescia, S.;  Robinson, A.;  Rossignol, T.;  Rowson, P. C.;  Roy, N.;  Saldanha, R.;  Sangiorgio, S.;  Schmidt, S.;  Schubert, A.;  Sinclair, D.;  Skarpaas, K.;  Soma, A. K.;  St-Hilaire, G.;  Stekhanov, V.;  Stiegler, T.;  Sun, X. L.;  Tarka, M.;  Todd, J.;  Tolba, T.;  Totev, T. I.;  Tsang, R.;  Tsang, T.;  Vachon, F.;  Veenstra, B.;  Veeraraghavan, V.;  Visser, G.;  Vuilleumier, J.;  Wang, Q.;  Watkins, J.;  Weber, M.;  Wei, W.;  Wen, L. J.;  Wichoski, U.;  Wrede, G.;  Wu, S. X.;  Wu, W. H.;  Xia, Q.;  Yang, L.;  Yen, Y.;  Zeldovich, O.;  Zhang, X.;  Zhao, J.;  Zhou, Y.;  Jamil, A;  Ziegler, T;  Hufschmidt, P;  Li, G;  Lupin-Jimenez, L;  Michel, T;  Ostrovskiy, I;  Retiere, F;  Schneider, J;  Wagenpfeil, M;  Alamre, A;  Albert, JB;  Anton, G;  Arnquist, IJ;  Badhrees, I;  Barbeau, PS;  Beck, D;  Belov, V;  Bhatta, T;  Bourque, E;  Brodsky, JP;  Brown, E;  Brunner, T;  Burenkov, A;  Cao, GF;  Cao, L;  Cen, WR;  Chambers, C;  Charlebois, SA;  Chiu, M;  Clevel;  , B;  Coon, M;  Cote, M;  Craycraft, A;  Cree, W;  Dalmasson, J;  Daniels, T;  Darroch, L;  Daugherty, SJ;  Daughhetee, J;  Delaquis, S;  Mesrobian-Kabakian, AD;  DeVoe, R;  Dilling, J;  Ding, YY;  Dolinski, MJ;  Dragone, A;  Echevers, J;  Fabris, L;  Fairbank, D;  Fairbank, W;  Farine, J;  Feyzbakhsh, S;  Fontaine, R;  Fudenberg, D;  Gallina, G;  Giacomini, G;  Gornea, R;  Grata, G;  Hansen, EV;  Harris, D;  Hasan, M;  Heffner, M;  Hoessl, J;  Hoppe, EW;  House, A;  Hughes, M;  Ito, Y;  Iverson, A;  Jessiman, C;  Jewell, MJ;  Jiang, XS;  Karelin, A;  Kaufman, LJ;  Koffas, T;  Kravitz, S;  Krucken, R;  Kuchenkov, A;  Kumar, KS;  Lan, Y;  Larson, A;  Leonard, DS;  Li, S;  Li, Z;  Licciardi, C;  Lin, YH;  Lv, P;  MacLellan, R;  Mong, B;  Moore, DC;  Murray, K;  Newby, RJ;  Ning, Z;  Njoya, O;  Nolet, F;  Nusair, O;  Odgers, K;  Odian, A;  Oriunno, M;  Orrell, JL;  Ortega, GS;  Overman, CT;  Parent, S;  Piepke, A;  Pocar, A;  Pratte, JE;  Qiu, D;  Radeka, V;  Raguzin, E;  Rao, T;  Rescia, S;  Robinson, A;  Rossignol, T;  Rowson, PC;  Roy, N;  Saldanha, R;  Sangiorgio, S;  Schmidt, S;  Schubert, A;  Sinclair, D;  Skarpaas, K;  Soma, AK;  St-Hilaire, G;  Stekhanov, V;  Stiegler, T;  Sun, XL;  Tarka, M;  Todd, J;  Tolba, T;  Totev, TI;  Tsang, R;  Tsang, T;  Vachon, F;  Veenstra, B;  Veeraraghavan, V;  Visser, G;  Vuilleumier, JL;  Wang, Q;  Watkins, J;  Weber, M;  Wei, W;  Wen, LJ;  Wichoski, U;  Wrede, G;  Wu, SX;  Wu, WH;  Xia, Q;  Yang, L;  Yen, YR;  Zeldovich, O;  Zhang, X;  Zhao, J;  Zhou, Y
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nEXO  photodetectors  silicon photomultiplier  vacuum ultraviolet (VUV) light  xenon detectors  
Trace radioactive impurities in final construction materials for EXO-200 期刊论文
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2017, 卷号: 871, 页码: 169-179
Authors:  Leonard, DS;  Auty, DJ;  Didberidze, T;  Gornea, R;  Grinberg, P;  MacLellan, R;  Methven, B;  Piepke, A;  Vuilleumier, JL;  Albert, JB;  Anton, G;  Badhrees, I;  Barbeau, PS;  Bayerlein, R;  Beck, D;  Belov, V;  Breidenbach, M;  Brunner, T;  Cao, GF;  Cen, WR;  Chambers, C;  Cleveland, B;  Coon, M;  Craycraft, A;  Cree, W;  Daniels, T;  Danilov, M;  Daugherty, SJ;  Daughhetee, J;  Davis, J;  Delaquis, S;  Mesrobian-Kabakian, AD;  DeVoe, R;  Dilling, J;  Dolgolenko, A;  Dolinski, MJ;  Fairbank, W;  Farine, J;  Feyzbakhsh, S;  Fierlinger, P;  Fudenberg, D;  Graham, K;  Gratta, G;  Hall, C;  Herrin, S;  Hoessl, J;  Hufschmidt, P;  Hughes, M;  Jamil, A;  Jewell, MJ;  Johnson, A;  Johnston, S;  Karelin, A;  Kaufman, LJ;  Koffas, T;  Kravitz, S;  Krcken, R;  Kuchenkov, A;  Kumar, KS;  Lan, Y;  LePort, F;  Li, S;  Licciardi, C;  Lin, YH;  Mackay, D;  Marino, MG;  Michel, T;  Mong, B;  Moore, D;  Murray, K;  Neilson, R;  Nelson, R;  Njoya, O;  Odian, A;  Ostrovskiy, I;  Pocar, A;  Pushkin, K;  RetiSre, F;  Rowson, PC;  Russell, JJ;  Schubert, A;  Sinclair, D;  Smith, E;  Stekhanov, V;  Tarka, M;  Tolba, T;  Tsang, R;  Wagenpfeil, M;  Waite, A;  Walton, J;  Walton, T;  Wamba, K;  Weber, M;  Wen, LJ;  Wichoski, U;  Wodin, J;  Yang, L;  Yen, YR;  Zeldovich, OY;  Zettlemoyer, J;  Ziegler, T;  Cao GF(曹国富);  Cen WR(岑吴镕);  T.tolba;  Wen LJ(温良剑)
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Radiopurity  Ultra-trace analysis  Neutron activation analysis  Mass spectrometry  Mass spectroscopy  Germanium counting  Alpha counting  Low background  Double beta decay  EXO  EXO-200  
A Global R&D Program on Liquid Ar Time Projection Chambers Under Execution at the University of BernOriginal Research Article 会议论文
Proceedings of the 2nd International Conference on Technology and Instrumentation in Particle Physics (TIPP 2011), Chicago, IL, USA, 2011
Authors:  I. Badhrees
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