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Measurement and calculation of escape peak intensities in synchrotron radiation X-ray fluorescence analysis 期刊论文
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2002, 卷号: 192, 期号: 4, 页码: 365-369
Authors:  Kang, SX;  Sun, X;  Ju X(巨新);  Huang YY(黄宇营);  Xian DC(冼鼎昌);  Ju, X;  Huang, YY;  Yao, K;  Wu, ZQ;  Xian, DC
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synchrotron radiation X-ray fluorescence analysis  Si(Li) detector  escape peak