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Advances in applications of positron annihilation spectroscopy to investigating semiconductor microstructures 期刊论文
ACTA PHYSICA SINICA物理学报, 2017, 卷号: 66, 期号: 2, 页码: 27801
Authors:  Cao XZ(曹兴忠);  Song LG(宋力刚);  Jin SX(靳硕学);  Wang BY(王宝义);  Wei L(魏龙);  Cao, XZ;  Song, LG;  Jin, SX;  Zhang, RG;  Wang, BY;  Wei, L
Adobe PDF(974Kb)  |  Favorite  |  View/Download:140/1  WOS cited times:[0]  CSCD cited times:[1]  |  Submit date:2019/08/27
positron annihilation spectroscopy  semiconductor  electron density and momentum distribution  microstructure  
Effect of annealing temperature on the microstructure and scintillation properties of CsI(Tl) films 期刊论文
JOURNAL OF INORGANIC MATERIALS, 2008, 卷号: 23, 期号: 4, 页码: 749-752
Authors:  Cheng F(程峰);  Zhong YR(钟玉荣);  Wang BY(王宝义);  Wei L(魏龙);  Cheng, F;  Zhong, YR;  Wang, BY;  Wang, TM;  Wei, L
Adobe PDF(472Kb)  |  Favorite  |  View/Download:76/1  WOS cited times:[0]  |  Submit date:2016/06/28
CsI films  microstructure  scintillation properties  
Microstructural features of DC sputtered vanadium oxide thin films 期刊论文
ACTA PHYSICA SINICA, 2004, 卷号: 53, 期号: 6, 页码: 1956-1960
Authors:  Pan MX(潘梦霄);  Cao XZ(曹兴忠);  Wang BY(王宝义);  Ma CX(马创新);  Zhou CL(周春兰);  Wei L(魏龙);  Pan, MX;  Cao, XZ;  Li, YX;  Wang, BY;  Xue, DS;  Ma, CX;  Zhou, CL;  Wei, L
Adobe PDF(397Kb)  |  Favorite  |  View/Download:86/0  WOS cited times:[0]  |  Submit date:2016/06/29
microstructure  thin films of vanadium oxides  preferred orientation  DC magnetron sputtering