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Direct preparation and microstructure investigation of p-type transparent conducting Ga-doped SnO2 thin films 期刊论文
POWDER DIFFRACTION, 2010, 卷号: 25, 期号: 3, 页码: S36-S39
Authors:  Yang TY(杨铁莹);  Qin XB(秦秀波);  Wang HH(王焕华);  Jia QJ(贾全杰);  Yu RS(于润升);  Wang BY(王宝义);  Wang JO(王嘉鸥);  Kui RX(奎热西);  Jiang XM(姜晓明);  Yang, TY;  Qin, XB;  Wang, HH;  Jia, QJ;  Yu, RS;  Wang, BY;  Wang, JO;  Ibrahim, K;  Jiang, XM
Adobe PDF(275Kb)  |  Favorite  |  View/Download:318/0  WOS cited times:[0]  ADS cited times:[0]  |  Submit date:2016/06/29
p-type transparent conducting oxide  Ga-doped SnO2 thin film  reactive rf-magnetron sputtering  microstructure  X-ray diffraction  X-ray specular reflectivity