×
验证码:
换一张
Forgotten Password?
Stay signed in
China Science and Technology Network Pass Registration
×
China Science and Technology Network Pass Registration
Log In
Chinese
|
English
中国科学院高能物理研究所机构知识库
Knowledge Management System Of Institute of High Energy
Log In
Register
ALL
ORCID
Title
Alternative Title
Creator
Subject Area
Keyword
Document Type
Source Publication
Indexed By
Publisher
Date Issued
Date Accessioned
Funding Project
MOST Discipline Catalogue
Correlation
Research Direction
inspireid
MedlineID
major scientific facilities
ATEL Number
serial number
Study Hall
Image search
Paste the image URL
Home
Collections
Authors
DocType
Subjects
K-Map
STIF
News
Search in the results
Collection
LHAASO [1]
Authors
Document Type
Patent [1]
Date Issued
2018 [1]
Language
Source Publication
Funding Project
Indexed By
Audience
Correlation
Division Name
Problem category
×
Knowledge Map
IHEP OpenIR
Start a Submission
Submissions
Unclaimed
Claimed
Attach Fulltext
Bookmarks
QQ
Weibo
Feedback
Browse/Search Results:
1-1 of 1
Help
Filters
Document Type：专利
Selected(
0
)
Clear
Items/Page:
5
10
15
20
25
30
35
40
45
50
55
60
65
70
75
80
85
90
95
100
Sort:
Select
Issue Date Ascending
Issue Date Descending
WOS Cited Times Ascending
WOS Cited Times Descending
Submit date Ascending
Submit date Descending
Title Ascending
Title Descending
Journal Impact Factor Ascending
Journal Impact Factor Descending
Author Ascending
Author Descending
Correlation Ascending
Correlation Descending
一种同时测量光在探测器里反射步长和Tyvek反射率的方法
专利
专利类型: 发明专利, 专利号: ZL201710398214.2, 申请日期: 2018-08-21,
Inventors:
李秀荣
;
肖刚
;
左雄
;
冯少辉
;
李骢
;
王玲玉
;
程宁
Favorite
|
View/Download：21/0
|
Submit date：2022/03/02
