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Radiation hardness studies of AMS HV-CMOS 350nm prototype chip HVStripV1 期刊论文
JOURNAL OF INSTRUMENTATION, 2017, 卷号: 12, 页码: 2010
作者:  Kanisauskas, K;  Affolder, A;  Arndt, K;  Bates, R;  Benoit, M;  Di Bello, F;  Blue, A;  Bortoletto, D;  Buckland, M;  Buttar, C;  Caragiulo, P;  Das, D;  Dopke, J;  Dragone, A;  Ehrler, F;  Fadeyev, V;  Galloway, Z;  Grabas, H;  Gregor, IM;  Grenier, P;  Grillo, A;  Hiti, B;  Hoeferkamp, M;  Hommels, LBA;  Huffman, BT;  John, J;  Kenney, C;  Kramberger, J;  Liang, Z;  Mandic, I;  Maneuski, D;  Martinez-Mckinney, F;  MacMahon, S;  Meng, L;  Mikuz, M;  Muenstermann, D;  Nickerson, R;  Peric, I;  Phillips, P;  Plackett, R;  Rubbo, F;  Segal, J;  Seidel, S;  Seiden, A;  Shipsey, I;  Song, W;  Staniztki, M;  Su, D;  Tamma, C;  Turchetta, R;  Vigani, L;  Volk, J;  Wang, R;  Warren, M;  Wilson, F;  Worm, S;  Xiu, Q;  Zhang, J;  Zhu, H;  Song WM(宋维民)
Adobe PDF(1069Kb)  |  收藏  |  浏览/下载:209/0  WOS被引:[0]  INSPIRE被引:[3]  ADS被引:[2]  |  提交时间:2019/08/27
Radiation-hard detectors  Solid state detectors  Si microstrip and pad detectors  
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