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| Sample and Detector Positioning Instruments for the Wide Angle XPCS End Station at 8-ID-E, a Feature Beamline for the APS Upgrade | |
| K.J. Wakefield; S.J. Bean; D. Capatina; E.M. Dufresne; M.V. Fisher; M.J. Highland; S. Narayanan; A. Sandy; R. Ziegler | |
| 2021 | |
| Source Publication | Proceedings of the 11th International Conference on Mechanical Engineering Design of Synchrotron Radiation Equipment and Instrumentation |
| Conference Date | 2021 |
| Conference Place | Chicago |
| Language | 英语 |
| Document Type | 会议论文 |
| Identifier | http://ir.ihep.ac.cn/handle/311005/292728 |
| Collection | 学术会议_国际参会_JaCoW高能所参会会议_MEDSI |
| Affiliation | ANL, Lemont, Illinois, USA |
| Recommended Citation GB/T 7714 | K.J. Wakefield,S.J. Bean,D. Capatina,et al. Sample and Detector Positioning Instruments for the Wide Angle XPCS End Station at 8-ID-E, a Feature Beamline for the APS Upgrade[C],2021. |
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