一种同时测量光在探测器里反射步长和Tyvek反射率的方法

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	一种同时测量光在探测器里反射步长和Tyvek反射率的方法
	李秀荣; 肖刚; 左雄; 冯少辉; 李骢; 王玲玉; 程宁
	2018-08-21
Rights Holder	中国科学院高能物理研究所
Subtype	发明专利
Patent Number	ZL201710398214.2
Document Type	专利
Identifier	http://ir.ihep.ac.cn/handle/311005/292202
Collection	高海拔宇宙线观测站
Recommended Citation GB/T 7714	李秀荣,肖刚,左雄,等. 一种同时测量光在探测器里反射步长和Tyvek反射率的方法. ZL201710398214.2[P]. 2018-08-21.

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