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A Sub-Micron Resolution, Bunch-by-Bunch Beam Trajectory Feedback System and Its Application to Reducing Wakefield Effects in Single-Pass Beamlines
D.R. Bett; P. Burrows; C. Perry; R.L. Ramjiawan
2021
Source PublicationProceedings of the 12th International Particle Accelerator Conference
Conference Date2021
Conference PlaceBrazil
Document Type会议论文
Identifierhttp://ir.ihep.ac.cn/handle/311005/290672
Collection学术会议_国际参会_JaCoW高能所参会会议_IPAC
AffiliationJAI, Oxford, United Kingdom
Recommended Citation
GB/T 7714
D.R. Bett,P. Burrows,C. Perry,et al. A Sub-Micron Resolution, Bunch-by-Bunch Beam Trajectory Feedback System and Its Application to Reducing Wakefield Effects in Single-Pass Beamlines[C],2021.
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TUPAB020.pdf(1785KB)会议论文 限制开放CC BY-NC-SAApplication Full Text
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