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Measuring the Beam Profile by Counting Ionization Electrons
H.S. Sandberg; W. Bertsche
2019
Source PublicationProceedings of the 8th International Beam Instrumentation Conference
Conference Date2019
Conference PlaceSweden
Language英语
inspireid1822636
Citation statistics
Cited Times:0 [INSPIRE]
Document Type会议论文
Identifierhttp://ir.ihep.ac.cn/handle/311005/288650
Collection学术会议_国际参会_JaCoW高能所参会会议_IBIC
AffiliationUMAN, Manchester, United Kingdom
Recommended Citation
GB/T 7714
H.S. Sandberg,W. Bertsche. Measuring the Beam Profile by Counting Ionization Electrons[C],2019.
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TUBO04.pdf(398KB)会议论文 限制开放CC BY-NC-SAApplication Full Text
tubo04_talk.pdf(2151KB)会议论文 限制开放CC BY-NC-SAApplication Full Text
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