IHEP OpenIR  > 学术会议  > 国际参会  > JaCoW高能所参会会议  > IBIC
Cherenkov Diffraction Radiation as a tool for beam diagnostics
T. Lefèvre; D. Alves; M. Bergamaschi; A. Curcio; O.R. Jones; R. Kieffer; S. Mazzoni; N. Mounet; A. Schlogelhofer; E. Senes
2019
Source PublicationProceedings of the 8th International Beam Instrumentation Conference
Conference Date2019
Conference PlaceSweden
Language英语
inspireid1822716
Citation statistics
Cited Times:3 [INSPIRE]
Document Type会议论文
Identifierhttp://ir.ihep.ac.cn/handle/311005/288637
Collection学术会议_国际参会_JaCoW高能所参会会议_IBIC
AffiliationCERN, Meyrin, Switzerland
Recommended Citation
GB/T 7714
T. Lefèvre,D. Alves,M. Bergamaschi,et al. Cherenkov Diffraction Radiation as a tool for beam diagnostics[C],2019.
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thao01_talk.pdf(10412KB)会议论文 限制开放CC BY-NC-SAApplication Full Text
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