IHEP OpenIR
VUV-Sensitive Silicon Photomultipliers for Xenon Scintillation Light Detection in nEXO
Jamil, A.; Ziegler, T.; Hufschmidt, P.; Li, G.; Lupin-Jimenez, L.; Michel, T.; Ostrovskiy, I.; Retière, F.; Schneider, J.; Wagenpfeil, M.; Alamre, A.; Albert, J.B.; Anton, G.; Arnquist, I.J.; Badhrees, I.; Barbeau, P.S.; Beck, D.; Belov, V.; Bhatta, T.; Bourque, F.; Brodsky, J.P.; Brown, E.; Brunner, T.; Burenkov, A.; Cao, G.F.; Cao, L.; Cen, W.R.; Chambers, C.; Charlebois, S.A.; Chiu, M.; Clevel; , B.; Coon, M.; Côté, M.; Craycraft, A.; Cree, W.; Dalmasson, J.; Daniels, T.; Darroch, L.; Daugherty, S.J.; Daughhetee, J.; Delaquis, S.; Mesrobian-Kabakian, A. Der; DeVoe, R.; Dilling, J.; Ding, Y.Y.; Dolinski, M.J.; Dragone, A.; Echevers, J.; Fabris, L.; Fairbank, D.; Fairbank, W.; Farine, J.; Feyzbakhsh, S.; Fontaine, R.; Fudenberg, D.; Gallina, G.; Giacomini, G.; Gornea, R.; Gratta, G.; Hansen, E.V.; Harris, D.; Hasan, M.; Heffner, M.; Hößl, J.; Hoppe, E.W.; House, A.; Hughes, M.; Ito, Y.; Iverson, A.; Jessiman, C.; Jewell, M.J.; Jiang, X.S.; Karelin, A.; Kaufman, L.J.; Koffas, T.; Kravitz, S.; Krücken, R.; Kuchenkov, A.; Kumar, K.S.; Lan, Y.; Larson, A.; Leonard, D.S.; Li, S.; Li, Z.; Licciardi, C.; Lin, Y.H.; Lv, P.; MacLellan, R.; Mong, B.; Moore, D.C.; Murray, K.; Newby, R.J.; Ning, Z.; Njoya, O.; Nolet, F.; Nusair, O.; Odgers, K.; Odian, A.; Oriunno, M.; Orrell, J.L.; Ortega, G.S.; Overman, C.T.; Parent, S.; Piepke, A.; Pocar, A.; Pratte, J.-F.; Qiu, D.; Radeka, V.; Raguzin, E.; Rao, T.; Rescia, S.; Robinson, A.; Rossignol, T.; Rowson, P.C.; Roy, N.; Saldanha, R.; Sangiorgio, S.; Schmidt, S.; Schubert, A.; Sinclair, D.; Skarpaas, K.; Soma, A.K.; St-Hilaire, G.; Stekhanov, V.; Stiegler, T.; Sun, X.L.; Tarka, M.; Todd, J.; Tolba, T.; Totev, T.I.; Tsang, R.; Tsang, T.; Vachon, F.; Veenstra, B.; Veeraraghavan, V.; Visser, G.; Vuilleumier, J.-L.; Wang, Q.; Watkins, J.; Weber, M.; Wei, W.; Wen, L.J.; Wichoski, U.; Wrede, G.; Wu, S.X.; Wu, W.H.; Xia, Q.; Yang, L.; Yen, Y.-R.; Zeldovich, O.; Zhang, X.; Zhao, J.; Zhou, Y.; Jamil, A.; Ziegler, T.; Hufschmidt, P.; Li, G.; Lupin-Jimenez, L.; Michel, T.; Ostrovskiy, I.; Retière, F.; Schneider, J.; Wagenpfeil, M.; Alamre, A.; Albert, J. B.; Anton, G.; Arnquist, I. J.; Badhrees, I.; Barbeau, P. S.; Beck, D.; Belov, V.; Bhatta, T.; Bourque, F.; Brodsky, J. P.; Brown, E.; Brunner, T.; Burenkov, A.; Cao, G. F.; Cao, L.; Cen, W. R.; Chambers, C.; Charlebois, S. A.; Chiu, M.; Clevel; , B.; Coon, M.; Côté, M.; Craycraft, A.; Cree, W.; Dalmasson, J.; Daniels, T.; Darroch, L.; Daugherty, S. J.; Daughhetee, J.; Delaquis, S.; Mesrobian-Kabakian, A. D.; DeVoe, R.; Dilling, J.; Ding, Y. Y.; Dolinski, M. J.; Dragone, A.; Echevers, J.; Fabris, L.; Fairbank, D.; Fairbank, W.; Farine, J.; Feyzbakhsh, S.; Fontaine, R.; Fudenberg, D.; Gallina, G.; Giacomini, G.; Gornea, R.; Gratta, G.; Hansen, E. V.; Harris, D.; Hasan, M.; Heffner, M.; Hößl, J.; Hoppe, E. W.; House, A.; Hughes, M.; Ito, Y.; Iverson, A.; Jessiman, C.; Jewell, M. J.; Jiang, X. S.; Karelin, A.; Kaufman, L. J.; Koffas, T.; Kravitz, S.; Krücken, R.; Kuchenkov, A.; Kumar, K. S.; Lan, Y.; Larson, A.; Leonard, D. S.; Li, S.; Li, Z.; Licciardi, C.; Lin, Y. H.; Lv, P.; MacLellan, R.; Mong, B.; Moore, D. C.; Murray, K.; Newby, R. J.; Ning, Z.; Njoya, O.; Nolet, F.; Nusair, O.; Odgers, K.; Odian, A.; Oriunno, M.; Orrell, J. L.; Ortega, G. S.; Overman, C. T.; Parent, S.; Piepke, A.; Pocar, A.; Pratte, J.; Qiu, D.; Radeka, V.; Raguzin, E.; Rao, T.; Rescia, S.; Robinson, A.; Rossignol, T.; Rowson, P. C.; Roy, N.; Saldanha, R.; Sangiorgio, S.; Schmidt, S.; Schubert, A.; Sinclair, D.; Skarpaas, K.; Soma, A. K.; St-Hilaire, G.; Stekhanov, V.; Stiegler, T.; Sun, X. L.; Tarka, M.; Todd, J.; Tolba, T.; Totev, T. I.; Tsang, R.; Tsang, T.; Vachon, F.; Veenstra, B.; Veeraraghavan, V.; Visser, G.; Vuilleumier, J.; Wang, Q.; Watkins, J.; Weber, M.; Wei, W.; Wen, L. J.; Wichoski, U.; Wrede, G.; Wu, S. X.; Wu, W. H.; Xia, Q.; Yang, L.; Yen, Y.; Zeldovich, O.; Zhang, X.; Zhao, J.; Zhou, Y.; Jamil, A; Ziegler, T; Hufschmidt, P; Li, G; Lupin-Jimenez, L; Michel, T; Ostrovskiy, I; Retiere, F; Schneider, J; Wagenpfeil, M; Alamre, A; Albert, JB; Anton, G; Arnquist, IJ; Badhrees, I; Barbeau, PS; Beck, D; Belov, V; Bhatta, T; Bourque, E; Brodsky, JP; Brown, E; Brunner, T; Burenkov, A; Cao, GF; Cao, L; Cen, WR; Chambers, C; Charlebois, SA; Chiu, M; Clevel; , B; Coon, M; Cote, M; Craycraft, A; Cree, W; Dalmasson, J; Daniels, T; Darroch, L; Daugherty, SJ; Daughhetee, J; Delaquis, S; Mesrobian-Kabakian, AD; DeVoe, R; Dilling, J; Ding, YY; Dolinski, MJ; Dragone, A; Echevers, J; Fabris, L; Fairbank, D; Fairbank, W; Farine, J; Feyzbakhsh, S; Fontaine, R; Fudenberg, D; Gallina, G; Giacomini, G; Gornea, R; Grata, G; Hansen, EV; Harris, D; Hasan, M; Heffner, M; Hoessl, J; Hoppe, EW; House, A; Hughes, M; Ito, Y; Iverson, A; Jessiman, C; Jewell, MJ; Jiang, XS; Karelin, A; Kaufman, LJ; Koffas, T; Kravitz, S; Krucken, R; Kuchenkov, A; Kumar, KS; Lan, Y; Larson, A; Leonard, DS; Li, S; Li, Z; Licciardi, C; Lin, YH; Lv, P; MacLellan, R; Mong, B; Moore, DC; Murray, K; Newby, RJ; Ning, Z; Njoya, O; Nolet, F; Nusair, O; Odgers, K; Odian, A; Oriunno, M; Orrell, JL; Ortega, GS; Overman, CT; Parent, S; Piepke, A; Pocar, A; Pratte, JE; Qiu, D; Radeka, V; Raguzin, E; Rao, T; Rescia, S; Robinson, A; Rossignol, T; Rowson, PC; Roy, N; Saldanha, R; Sangiorgio, S; Schmidt, S; Schubert, A; Sinclair, D; Skarpaas, K; Soma, AK; St-Hilaire, G; Stekhanov, V; Stiegler, T; Sun, XL; Tarka, M; Todd, J; Tolba, T; Totev, TI; Tsang, R; Tsang, T; Vachon, F; Veenstra, B; Veeraraghavan, V; Visser, G; Vuilleumier, JL; Wang, Q; Watkins, J; Weber, M; Wei, W; Wen, LJ; Wichoski, U; Wrede, G; Wu, SX; Wu, WH; Xia, Q; Yang, L; Yen, YR; Zeldovich, O; Zhang, X; Zhao, J; Zhou, Y
2018
Source PublicationIEEE TRANSACTIONS ON NUCLEAR SCIENCE
ISSN0018-9499
EISSN1558-1578
Volume65Issue:11Pages:2823-2833
SubtypeArticle
AbstractFuture ton-scale liquefied noble gas detectors depend on efficient light detection in the vacuum ultraviolet (VUV) range. In the past years, silicon photomultipliers (SiPMs) have emerged as a valid alternative to standard photomultiplier tubes or large-area avalanche photodiodes. The next-generation double-beta decay experiment, nEXO, with a 5-ton liquid xenon time projection chamber will use SiPMs for detecting the 175-nm xenon scintillation light, in order to achieve an energy resolution of sigma/Q(beta beta) = 1%. This paper presents recent measurements of the VUV-HD generation SiPMs from Fondazione Bruno Kessler, Trento, Italy, in two complementary setups. It includes measurements of the photon-detection efficiency (PDE) with gaseous xenon scintillation light in a vacuum setup and dark measurements in a dry nitrogen gas setup. We report improved PDE at 175 nm compared to previous generation devices that would meet the criteria of nEXO. Furthermore, we present the projected nEXO detector light collection and energy resolution that could be achieved by using these SiPMs.
KeywordnEXO photodetectors silicon photomultiplier vacuum ultraviolet (VUV) light xenon detectors
DOI10.1109/TNS.2018.2875668
WOS KeywordDOUBLE-BETA DECAY
Indexed BySCI ; EI
Language英语
WOS Research AreaEngineering ; Nuclear Science & Technology
WOS SubjectEngineering, Electrical & Electronic ; Nuclear Science & Technology
WOS IDWOS:000450189800009
EI Accession Number20184305976052
ADS Bibcode2018ITNS...65.2823J
AXRIV CODE1806
inspireid1676616
Citation statistics
Cited Times:4[WOS]   [WOS Record]     [Related Records in WOS]
Document Type期刊论文
Identifierhttp://ir.ihep.ac.cn/handle/311005/286952
Collection中国科学院高能物理研究所
Affiliation中国科学院高能物理研究所
Recommended Citation
GB/T 7714
Jamil, A.,Ziegler, T.,Hufschmidt, P.,et al. VUV-Sensitive Silicon Photomultipliers for Xenon Scintillation Light Detection in nEXO[J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE,2018,65(11):2823-2833.
APA Jamil, A..,Ziegler, T..,Hufschmidt, P..,Li, G..,Lupin-Jimenez, L..,...&Zhou, Y.(2018).VUV-Sensitive Silicon Photomultipliers for Xenon Scintillation Light Detection in nEXO.IEEE TRANSACTIONS ON NUCLEAR SCIENCE,65(11),2823-2833.
MLA Jamil, A.,et al."VUV-Sensitive Silicon Photomultipliers for Xenon Scintillation Light Detection in nEXO".IEEE TRANSACTIONS ON NUCLEAR SCIENCE 65.11(2018):2823-2833.
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