VUV-Sensitive Silicon Photomultipliers for Xenon Scintillation Light Detection in nEXO

doi:10.1109/TNS.2018.2875668

IHEP OpenIR

	VUV-Sensitive Silicon Photomultipliers for Xenon Scintillation Light Detection in nEXO
	Jamil, A.; Ziegler, T.; Hufschmidt, P.; Li, G.; Lupin-Jimenez, L.; Michel, T.; Ostrovskiy, I.; Retière, F.; Schneider, J.; Wagenpfeil, M.; Alamre, A.; Albert, J.B.; Anton, G.; Arnquist, I.J.; Badhrees, I.; Barbeau, P.S.; Beck, D.; Belov, V.; Bhatta, T.; Bourque, F.; Brodsky, J.P.; Brown, E.; Brunner, T.; Burenkov, A.; Cao, G.F.; Cao, L.; Cen, W.R.; Chambers, C.; Charlebois, S.A.; Chiu, M.; Clevel; , B.; Coon, M.; Côté, M.; Craycraft, A.; Cree, W.; Dalmasson, J.; Daniels, T.; Darroch, L.; Daugherty, S.J.; Daughhetee, J.; Delaquis, S.; Mesrobian-Kabakian, A. Der; DeVoe, R.; Dilling, J.; Ding, Y.Y.; Dolinski, M.J.; Dragone, A.; Echevers, J.; Fabris, L.; Fairbank, D.; Fairbank, W.; Farine, J.; Feyzbakhsh, S.; Fontaine, R.; Fudenberg, D.; Gallina, G.; Giacomini, G.; Gornea, R.; Gratta, G.; Hansen, E.V.; Harris, D.; Hasan, M.; Heffner, M.; Hößl, J.; Hoppe, E.W.; House, A.; Hughes, M.; Ito, Y.; Iverson, A.; Jessiman, C.; Jewell, M.J.; Jiang, X.S.; Karelin, A.; Kaufman, L.J.; Koffas, T.; Kravitz, S.; Krücken, R.; Kuchenkov, A.; Kumar, K.S.; Lan, Y.; Larson, A.; Leonard, D.S.; Li, S.; Li, Z.; Licciardi, C.; Lin, Y.H.; Lv, P.; MacLellan, R.; Mong, B.; Moore, D.C.; Murray, K.; Newby, R.J.; Ning, Z.; Njoya, O.; Nolet, F.; Nusair, O.; Odgers, K.; Odian, A.; Oriunno, M.; Orrell, J.L.; Ortega, G.S.; Overman, C.T.; Parent, S.; Piepke, A.; Pocar, A.; Pratte, J.-F.; Qiu, D.; Radeka, V.; Raguzin, E.; Rao, T.; Rescia, S.; Robinson, A.; Rossignol, T.; Rowson, P.C.; Roy, N.; Saldanha, R.; Sangiorgio, S.; Schmidt, S.; Schubert, A.; Sinclair, D.; Skarpaas, K.; Soma, A.K.; St-Hilaire, G.; Stekhanov, V.; Stiegler, T.; Sun, X.L.; Tarka, M.; Todd, J.; Tolba, T.; Totev, T.I.; Tsang, R.; Tsang, T.; Vachon, F.; Veenstra, B.; Veeraraghavan, V.; Visser, G.; Vuilleumier, J.-L.; Wang, Q.; Watkins, J.; Weber, M.; Wei, W.; Wen, L.J.; Wichoski, U.; Wrede, G.; Wu, S.X.; Wu, W.H.; Xia, Q.; Yang, L.; Yen, Y.-R.; Zeldovich, O.; Zhang, X.; Zhao, J.; Zhou, Y.; Jamil, A.; Ziegler, T.; Hufschmidt, P.; Li, G.; Lupin-Jimenez, L.; Michel, T.; Ostrovskiy, I.; Retière, F.; Schneider, J.; Wagenpfeil, M.; Alamre, A.; Albert, J. B.; Anton, G.; Arnquist, I. J.; Badhrees, I.; Barbeau, P. S.; Beck, D.; Belov, V.; Bhatta, T.; Bourque, F.; Brodsky, J. P.; Brown, E.; Brunner, T.; Burenkov, A.; Cao, G. F.; Cao, L.; Cen, W. R.; Chambers, C.; Charlebois, S. A.; Chiu, M.; Clevel; , B.; Coon, M.; Côté, M.; Craycraft, A.; Cree, W.; Dalmasson, J.; Daniels, T.; Darroch, L.; Daugherty, S. J.; Daughhetee, J.; Delaquis, S.; Mesrobian-Kabakian, A. D.; DeVoe, R.; Dilling, J.; Ding, Y. Y.; Dolinski, M. J.; Dragone, A.; Echevers, J.; Fabris, L.; Fairbank, D.; Fairbank, W.; Farine, J.; Feyzbakhsh, S.; Fontaine, R.; Fudenberg, D.; Gallina, G.; Giacomini, G.; Gornea, R.; Gratta, G.; Hansen, E. V.; Harris, D.; Hasan, M.; Heffner, M.; Hößl, J.; Hoppe, E. W.; House, A.; Hughes, M.; Ito, Y.; Iverson, A.; Jessiman, C.; Jewell, M. J.; Jiang, X. S.; Karelin, A.; Kaufman, L. J.; Koffas, T.; Kravitz, S.; Krücken, R.; Kuchenkov, A.; Kumar, K. S.; Lan, Y.; Larson, A.; Leonard, D. S.; Li, S.; Li, Z.; Licciardi, C.; Lin, Y. H.; Lv, P.; MacLellan, R.; Mong, B.; Moore, D. C.; Murray, K.; Newby, R. J.; Ning, Z.; Njoya, O.; Nolet, F.; Nusair, O.; Odgers, K.; Odian, A.; Oriunno, M.; Orrell, J. L.; Ortega, G. S.; Overman, C. T.; Parent, S.; Piepke, A.; Pocar, A.; Pratte, J.; Qiu, D.; Radeka, V.; Raguzin, E.; Rao, T.; Rescia, S.; Robinson, A.; Rossignol, T.; Rowson, P. C.; Roy, N.; Saldanha, R.; Sangiorgio, S.; Schmidt, S.; Schubert, A.; Sinclair, D.; Skarpaas, K.; Soma, A. K.; St-Hilaire, G.; Stekhanov, V.; Stiegler, T.; Sun, X. L.; Tarka, M.; Todd, J.; Tolba, T.; Totev, T. I.; Tsang, R.; Tsang, T.; Vachon, F.; Veenstra, B.; Veeraraghavan, V.; Visser, G.; Vuilleumier, J.; Wang, Q.; Watkins, J.; Weber, M.; Wei, W.; Wen, L. J.; Wichoski, U.; Wrede, G.; Wu, S. X.; Wu, W. H.; Xia, Q.; Yang, L.; Yen, Y.; Zeldovich, O.; Zhang, X.; Zhao, J.; Zhou, Y.; Jamil, A; Ziegler, T; Hufschmidt, P; Li, G; Lupin-Jimenez, L; Michel, T; Ostrovskiy, I; Retiere, F; Schneider, J; Wagenpfeil, M; Alamre, A; Albert, JB; Anton, G; Arnquist, IJ; Badhrees, I; Barbeau, PS; Beck, D; Belov, V; Bhatta, T; Bourque, E; Brodsky, JP; Brown, E; Brunner, T; Burenkov, A; Cao, GF; Cao, L; Cen, WR; Chambers, C; Charlebois, SA; Chiu, M; Clevel; , B; Coon, M; Cote, M; Craycraft, A; Cree, W; Dalmasson, J; Daniels, T; Darroch, L; Daugherty, SJ; Daughhetee, J; Delaquis, S; Mesrobian-Kabakian, AD; DeVoe, R; Dilling, J; Ding, YY; Dolinski, MJ; Dragone, A; Echevers, J; Fabris, L; Fairbank, D; Fairbank, W; Farine, J; Feyzbakhsh, S; Fontaine, R; Fudenberg, D; Gallina, G; Giacomini, G; Gornea, R; Grata, G; Hansen, EV; Harris, D; Hasan, M; Heffner, M; Hoessl, J; Hoppe, EW; House, A; Hughes, M; Ito, Y; Iverson, A; Jessiman, C; Jewell, MJ; Jiang, XS; Karelin, A; Kaufman, LJ; Koffas, T; Kravitz, S; Krucken, R; Kuchenkov, A; Kumar, KS; Lan, Y; Larson, A; Leonard, DS; Li, S; Li, Z; Licciardi, C; Lin, YH; Lv, P; MacLellan, R; Mong, B; Moore, DC; Murray, K; Newby, RJ; Ning, Z; Njoya, O; Nolet, F; Nusair, O; Odgers, K; Odian, A; Oriunno, M; Orrell, JL; Ortega, GS; Overman, CT; Parent, S; Piepke, A; Pocar, A; Pratte, JE; Qiu, D; Radeka, V; Raguzin, E; Rao, T; Rescia, S; Robinson, A; Rossignol, T; Rowson, PC; Roy, N; Saldanha, R; Sangiorgio, S; Schmidt, S; Schubert, A; Sinclair, D; Skarpaas, K; Soma, AK; St-Hilaire, G; Stekhanov, V; Stiegler, T; Sun, XL; Tarka, M; Todd, J; Tolba, T; Totev, TI; Tsang, R; Tsang, T; Vachon, F; Veenstra, B; Veeraraghavan, V; Visser, G; Vuilleumier, JL; Wang, Q; Watkins, J; Weber, M; Wei, W; Wen, LJ; Wichoski, U; Wrede, G; Wu, SX; Wu, WH; Xia, Q; Yang, L; Yen, YR; Zeldovich, O; Zhang, X; Zhao, J; Zhou, Y
	2018
Source Publication	IEEE TRANSACTIONS ON NUCLEAR SCIENCE
ISSN	0018-9499
EISSN	1558-1578
Volume	65 Issue:11 Pages:2823-2833
Subtype	Article
Abstract	Future ton-scale liquefied noble gas detectors depend on efficient light detection in the vacuum ultraviolet (VUV) range. In the past years, silicon photomultipliers (SiPMs) have emerged as a valid alternative to standard photomultiplier tubes or large-area avalanche photodiodes. The next-generation double-beta decay experiment, nEXO, with a 5-ton liquid xenon time projection chamber will use SiPMs for detecting the 175-nm xenon scintillation light, in order to achieve an energy resolution of sigma/Q(beta beta) = 1%. This paper presents recent measurements of the VUV-HD generation SiPMs from Fondazione Bruno Kessler, Trento, Italy, in two complementary setups. It includes measurements of the photon-detection efficiency (PDE) with gaseous xenon scintillation light in a vacuum setup and dark measurements in a dry nitrogen gas setup. We report improved PDE at 175 nm compared to previous generation devices that would meet the criteria of nEXO. Furthermore, we present the projected nEXO detector light collection and energy resolution that could be achieved by using these SiPMs.
Keyword	nEXO photodetectors silicon photomultiplier vacuum ultraviolet (VUV) light xenon detectors
DOI	10.1109/TNS.2018.2875668
WOS Keyword	DOUBLE-BETA DECAY
Indexed By	SCI ; EI
Language	英语
WOS Research Area	Engineering ; Nuclear Science & Technology
WOS Subject	Engineering, Electrical & Electronic ; Nuclear Science & Technology
WOS ID	WOS:000450189800009
EI Accession Number	20184305976052
ADS Bibcode	2018ITNS...65.2823J
AXRIV CODE	1806
inspireid	1676616
Citation statistics	Cited Times:24[WOS] [WOS Record] [Related Records in WOS] Cited Times:18 [INSPIRE] Cited Times:20 [ADS]
Document Type	期刊论文
Identifier	http://ir.ihep.ac.cn/handle/311005/286952
Collection	中国科学院高能物理研究所
Affiliation	中国科学院高能物理研究所
Recommended Citation GB/T 7714	Jamil, A.,Ziegler, T.,Hufschmidt, P.,et al. VUV-Sensitive Silicon Photomultipliers for Xenon Scintillation Light Detection in nEXO[J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE,2018,65(11):2823-2833.
APA	Jamil, A..,Ziegler, T..,Hufschmidt, P..,Li, G..,Lupin-Jimenez, L..,...&Zhou, Y.(2018).VUV-Sensitive Silicon Photomultipliers for Xenon Scintillation Light Detection in nEXO.IEEE TRANSACTIONS ON NUCLEAR SCIENCE,65(11),2823-2833.
MLA	Jamil, A.,et al."VUV-Sensitive Silicon Photomultipliers for Xenon Scintillation Light Detection in nEXO".IEEE TRANSACTIONS ON NUCLEAR SCIENCE 65.11(2018):2823-2833.

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