| Characterization and on-line adjustment of the sagittal-bent Laue crystal profile | |
Dong WW(董伟伟); Cai Q(蔡泉) ; Yang FG(杨福桂); Liu X(刘旭); Yang JW(杨佼汪); Diao QS(刁千顺); 刘鹏(多); Zhang XW(张小威); Hu LF(胡凌飞); Dong, WW; Cai, Q; Yang, FG; Liu, X; Yang, JW; Diao, QS; Liu, P; Zhang, XW; Hu, LF
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| 2018 | |
| Source Publication | JOURNAL OF SYNCHROTRON RADIATION
 |
| ISSN | 1600-5775 |
| Volume | 25Pages:1346-1353 |
| Subtype | Article |
| Abstract | The sagittal-bent Laue monochromator can provide an ideal way to focus high-energy X-ray beams. However, the anticlastic curvature induced by sagittal bending has a great influence on the crystal performance. Thus, characterizing the bent-crystal shape is very important for predicting the performance of the bent-crystal monochromator. In this paper the crystal profile is measured by off-line optical metrology and on-line X-ray experiments. The off-line results showed that the bent-crystal surface could be well fitted to a saddle surface apart from a redundant cubic term which was related to the different couples applied on the crystal. On-line characterization of the meridional and the sagittal radius of the bent crystal includes double-crystal topography and ray-tracing measurement. In addition, the double-crystal topography experiment could be used as a quick diagnostic method for the bending condition adjustment. The sagittal radius of the bent crystal was characterized through a ray-tracing experiment by using a particularly designed tungsten mask. Moreover, rocking curves under different bending conditions were measured as well. The results were highly consistent with analytical results derived from the elastic theory. Furthermore, radii along different vertical positions under various bending conditions were measured and showed a quadratic relationship between the vertical positions and the meridional radii. |
| Keyword | sagittal-bent Laue crystal optical metrology double-crystal topography anticlastic curvature ray-tracing measurement |
| DOI | 10.1107/S1600577518008056 |
| WOS Keyword | SYNCHROTRON X-RAYS ; MONOCHROMATOR ; OPTICS ; DIFFRACTION ; RADIATION ; BEAMLINE |
| Indexed By | SCI ; EI |
| Language | 英语 |
| WOS Research Area | Instruments & Instrumentation ; Optics ; Physics |
| WOS Subject | Instruments & Instrumentation ; Optics ; Physics, Applied |
| WOS ID | WOS:000443810500006 |
| EI Accession Number | 20183705802094 |
| Citation statistics | |
| Document Type | 期刊论文 |
| Identifier | http://ir.ihep.ac.cn/handle/311005/286307 |
| Collection | 多学科研究中心 |
| Corresponding Author | Hu LF(胡凌飞) |
| Affiliation | 中国科学院高能物理研究所 |
| First Author Affilication | Institute of High Energy |
| Corresponding Author Affilication | Institute of High Energy |
| Recommended Citation GB/T 7714 | Dong WW,Cai Q,Yang FG,et al. Characterization and on-line adjustment of the sagittal-bent Laue crystal profile[J]. JOURNAL OF SYNCHROTRON RADIATION,2018,25:1346-1353. |
| APA | 董伟伟.,蔡泉.,杨福桂.,刘旭.,杨佼汪.,...&Hu, LF.(2018).Characterization and on-line adjustment of the sagittal-bent Laue crystal profile.JOURNAL OF SYNCHROTRON RADIATION,25,1346-1353. |
| MLA | 董伟伟,et al."Characterization and on-line adjustment of the sagittal-bent Laue crystal profile".JOURNAL OF SYNCHROTRON RADIATION 25(2018):1346-1353. |
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