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Characterization and on-line adjustment of the sagittal-bent Laue crystal profile
Dong WW(董伟伟); Cai Q(蔡泉); Yang FG(杨福桂); Liu X(刘旭); Yang JW(杨佼汪); Diao QS(刁千顺); 刘鹏(多); Zhang XW(张小威); Hu LF(胡凌飞); Dong, WW; Cai, Q; Yang, FG; Liu, X; Yang, JW; Diao, QS; Liu, P; Zhang, XW; Hu, LF
2018
Source PublicationJOURNAL OF SYNCHROTRON RADIATION
ISSN1600-5775
Volume25Pages:1346-1353
SubtypeArticle
AbstractThe sagittal-bent Laue monochromator can provide an ideal way to focus high-energy X-ray beams. However, the anticlastic curvature induced by sagittal bending has a great influence on the crystal performance. Thus, characterizing the bent-crystal shape is very important for predicting the performance of the bent-crystal monochromator. In this paper the crystal profile is measured by off-line optical metrology and on-line X-ray experiments. The off-line results showed that the bent-crystal surface could be well fitted to a saddle surface apart from a redundant cubic term which was related to the different couples applied on the crystal. On-line characterization of the meridional and the sagittal radius of the bent crystal includes double-crystal topography and ray-tracing measurement. In addition, the double-crystal topography experiment could be used as a quick diagnostic method for the bending condition adjustment. The sagittal radius of the bent crystal was characterized through a ray-tracing experiment by using a particularly designed tungsten mask. Moreover, rocking curves under different bending conditions were measured as well. The results were highly consistent with analytical results derived from the elastic theory. Furthermore, radii along different vertical positions under various bending conditions were measured and showed a quadratic relationship between the vertical positions and the meridional radii.
Keywordsagittal-bent Laue crystal optical metrology double-crystal topography anticlastic curvature ray-tracing measurement
DOI10.1107/S1600577518008056
WOS KeywordSYNCHROTRON X-RAYS ; MONOCHROMATOR ; OPTICS ; DIFFRACTION ; RADIATION ; BEAMLINE
Indexed BySCI ; EI
Language英语
WOS Research AreaInstruments & Instrumentation ; Optics ; Physics
WOS SubjectInstruments & Instrumentation ; Optics ; Physics, Applied
WOS IDWOS:000443810500006
EI Accession Number20183705802094
Citation statistics
Document Type期刊论文
Identifierhttp://ir.ihep.ac.cn/handle/311005/286307
Collection多学科研究中心
Corresponding AuthorHu LF(胡凌飞)
Affiliation中国科学院高能物理研究所
First Author AffilicationInstitute of High Energy
Corresponding Author AffilicationInstitute of High Energy
Recommended Citation
GB/T 7714
Dong WW,Cai Q,Yang FG,et al. Characterization and on-line adjustment of the sagittal-bent Laue crystal profile[J]. JOURNAL OF SYNCHROTRON RADIATION,2018,25:1346-1353.
APA 董伟伟.,蔡泉.,杨福桂.,刘旭.,杨佼汪.,...&Hu, LF.(2018).Characterization and on-line adjustment of the sagittal-bent Laue crystal profile.JOURNAL OF SYNCHROTRON RADIATION,25,1346-1353.
MLA 董伟伟,et al."Characterization and on-line adjustment of the sagittal-bent Laue crystal profile".JOURNAL OF SYNCHROTRON RADIATION 25(2018):1346-1353.
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