A Fully Integrated 0.055% INL X-ray CCD Readout ASIC with Incremental Delta Sigma ADC
Wang, YC; Cao, XF; Yu, Q; Yi, T; Lu, B; Chen, Y; Hong, ZL; Lu B(陆波); Chen Y(陈勇)
刊名IEEE TRANSACTIONS ON NUCLEAR SCIENCE
2016
卷号63期号:3页码:1733
关键词ASIC CCD readout incremental ESADC low noise
DOI10.1109/TNS.2016.2543261
文章类型Article
英文摘要A fully integrated 100 kHz X-ray charge coupled device (CCD) readout application specific integrated circuit (ASIC) employing delta sigma (Delta Sigma) digitization is presented. To achieve high linearity with small chip size and low power consumption, the correlated double sampling (CDS) is realized by the Sigma Delta ADC instead of the analog front end (AFE) as in conventional CCD readout circuits. Besides, the proposed decimation filter features simple structure and eases the integration. The chip is fabricated in 0.35 mu m CMOS technology and the measured integral nonlinearity (INL) throughout the input dynamic range of ASIC is 0.055% with 35.1 +/- 0.3 mu V input referred noise. A CCD detection system is built and tested with the sensitivity of CCD being 4 mu V/e(-). The integration test results show that the readout noise is 11.8 e(-) at 100 kHz readout pixel rate and the achieved energy spectrum resolution is 168 eV +/- 4.7 eV (Full Width at Half Maximum: FWHM) at 5.9 keV.
关键词[WOS]SYSTEM
语种英语
WOS记录号WOS:000382463600007
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被引频次:1[WOS]   [WOS记录]     [WOS相关记录]
文献类型期刊论文
条目标识符http://ir.ihep.ac.cn/handle/311005/260697
专题中国科学院高能物理研究所_粒子天体物理中心_期刊论文
中国科学院高能物理研究所_粒子天体物理中心
作者单位中国科学院高能物理研究所
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Wang, YC,Cao, XF,Yu, Q,et al. A Fully Integrated 0.055% INL X-ray CCD Readout ASIC with Incremental Delta Sigma ADC[J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE,2016,63(3):1733.
APA Wang, YC.,Cao, XF.,Yu, Q.,Yi, T.,Lu, B.,...&陈勇.(2016).A Fully Integrated 0.055% INL X-ray CCD Readout ASIC with Incremental Delta Sigma ADC.IEEE TRANSACTIONS ON NUCLEAR SCIENCE,63(3),1733.
MLA Wang, YC,et al."A Fully Integrated 0.055% INL X-ray CCD Readout ASIC with Incremental Delta Sigma ADC".IEEE TRANSACTIONS ON NUCLEAR SCIENCE 63.3(2016):1733.
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