Observation of van Hove Singularities in Twisted Silicene Multilayers
Li, Z; Zhuang, JC; Chen, L; Ni, ZY; Liu, C; Wang, L; Xu, X; Wang, JO; Pi, XD; Wang, XL; Du, Y; Wu, KH; Dou, SX; Liu C(刘晨); Wang JO(王嘉鸥)
刊名ACS CENTRAL SCIENCE
2016
卷号2期号:8页码:517-521
DOI10.1021/acscentsci.6b00152
文章类型期刊论文
英文摘要Interlayer interactions perturb the electronic structure of two-dimensional materials and lead to new physical phenomena, such as van Hove singularities and Hofstadter's butterfly pattern. Silicene, the recently discovered two-dimensional form of silicon, is quite unique, in that silicon atoms adopt competing sp(2) and sp(3) hybridization states leading to a low-buckled structure promising relatively strong interlayer interaction. In multilayer silicene, the stacking order provides an important yet rarely explored degree of freedom for tuning its electronic structures through manipulating interlayer coupling. Here, we report the emergence of van Hove singularities in the multilayer silicene created by an interlayer rotation. We demonstrate that even a large-angle rotation (>20 degrees) between stacked silicene layers can generate a Moire pattern and van Hove singularities due to the strong interlayer coupling in multilayer silicene. Our study suggests an intriguing method for expanding the tunability of the electronic structure for electronic applications in this two-dimensional material.
类目[WOS]Chemistry, Multidisciplinary
关键词[WOS]AUGMENTED-WAVE METHOD ; GRAPHENE ; AG(111)
语种英语
WOS记录号WOS:000384750300008
引用统计
被引频次:7[WOS]   [WOS记录]     [WOS相关记录]
文献类型期刊论文
条目标识符http://ir.ihep.ac.cn/handle/311005/260386
专题中国科学院高能物理研究所_多学科研究中心_期刊论文
中国科学院高能物理研究所_多学科研究中心
作者单位中国科学院高能物理研究所
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GB/T 7714
Li, Z,Zhuang, JC,Chen, L,et al. Observation of van Hove Singularities in Twisted Silicene Multilayers[J]. ACS CENTRAL SCIENCE,2016,2(8):517-521.
APA Li, Z.,Zhuang, JC.,Chen, L.,Ni, ZY.,Liu, C.,...&王嘉鸥.(2016).Observation of van Hove Singularities in Twisted Silicene Multilayers.ACS CENTRAL SCIENCE,2(8),517-521.
MLA Li, Z,et al."Observation of van Hove Singularities in Twisted Silicene Multilayers".ACS CENTRAL SCIENCE 2.8(2016):517-521.
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