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Microstructure variation in fused silica irradiated by different fluence of UV laser pulses with positron annihilation lifetime and Raman scattering spectroscopy
Li, CH; Zheng, WG; Zhu, QH; Chen, J; Wang, BY; Ju, X; Wang BY(王宝义)
2016
Source PublicationNUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
ISSN0168-583X
EISSN1872-9584
Volume384Pages:23-29
SubtypeArticle
AbstractWe present an original study on the non-destructive evaluation of the microstructure evolution of fused silica induced by pulsed UV laser irradiation at low fluence (less than 50% F-th). Positron annihilation spectroscopy discloses that the spatial size of the vacancy cluster is increased exponentially with the linearly elevated laser fluence. Particularly, the vacancy cluster size in bulk silica is significantly increased by 14.5% after irradiated by pulsed 355 nm laser at F = 14 J/cm(2) (50% F-th), while the void size varies only 2%. UV laser-excited Raman results suggest that the bond length and average bond angle of Si-O-Si bridging bond are both slightly reduced. Results reveals that the rearrangement process of (Si-O)(n) fold rings and breakage of the Si-O bridging bond in bulk silica occurred during pulsed UV laser irradiation. The micro-structural changes were taken together to clarify the effect of sub-threshold laser fluence on material stability of silica glass. The obtained data provide important information for studying material stability and controlling the lifetime of fused silica optics for high power laser system. (C) 2016 Elsevier B.V. All rights reserved.
KeywordFused silica Microstructure variation Laser damage Positron annihilation lifetime Raman spectroscopy
DOI10.1016/j.nimb.2016.07.018
WOS KeywordNATIONAL-IGNITION-FACILITY ; EXIT-SURFACE ; DAMAGE PRECURSORS ; INDUCED BREAKDOWN ; AMORPHOUS SILICA ; VITREOUS SILICA ; INDUCED DEFECTS ; HIGH-PRESSURE ; 351 NM ; GROWTH
Indexed BySCI ; ADS
Language英语
WOS SubjectInstruments & Instrumentation ; Nuclear Science & Technology ; Physics, Atomic, Molecular & Chemical ; Physics, Nuclear
WOS IDWOS:000383941400004
ADS Bibcode2016NIMPB.384...23L
ADS URLhttps://ui.adsabs.harvard.edu/abs/2016NIMPB.384...23L
ADS CITATIONShttps://ui.adsabs.harvard.edu/abs/2016NIMPB.384...23L/citations
Citation statistics
Cited Times:6 [ADS]
Document Type期刊论文
Identifierhttp://ir.ihep.ac.cn/handle/311005/260332
Collection多学科研究中心
Affiliation中国科学院高能物理研究所
Recommended Citation
GB/T 7714
Li, CH,Zheng, WG,Zhu, QH,et al. Microstructure variation in fused silica irradiated by different fluence of UV laser pulses with positron annihilation lifetime and Raman scattering spectroscopy[J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS,2016,384:23-29.
APA Li, CH.,Zheng, WG.,Zhu, QH.,Chen, J.,Wang, BY.,...&王宝义.(2016).Microstructure variation in fused silica irradiated by different fluence of UV laser pulses with positron annihilation lifetime and Raman scattering spectroscopy.NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS,384,23-29.
MLA Li, CH,et al."Microstructure variation in fused silica irradiated by different fluence of UV laser pulses with positron annihilation lifetime and Raman scattering spectroscopy".NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS 384(2016):23-29.
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