IHEP OpenIR
Structure analysis of bimetallic Co-Au nanoparticles formed by sequential ion implantation
Chen, HJ; Wang, YH; Zhang, XJ; Song, SP; Chen, H; Zhang, K; Xiong, ZZ; Ji, LL; Dai, HM; Wang, DJ; Lu, JD; Wang, RW; Zheng, LR; Zheng LR(郑黎荣)
2016
Source PublicationAPPLIED SURFACE SCIENCE
ISSN0169-4332
EISSN1873-5584
Volume378Pages:191-195
SubtypeArticle
AbstractCo-Au alloy Metallic nanoparticles (MNPs) are formed by sequential ion implantation of Co and Au into silica glass at room temperature. The ion ranges of Au ions implantation process have been displayed to show the ion distribution. We have used the atomic force microscopy (AFM) and transmission electron microscopy (TEM) to investigate the formation of bimetallic nanoparticles. The extended X-ray absorption fine structure (EXAFS) has been used to study the local structural information of bimetallic nanoparticles. With the increase of Au ion implantation, the local environments of Co ions are changed enormously. Hence, three oscillations, respectively, Co-O, Co-Co and Co-Au coordination are determined. (C) 2016 Elsevier B.V. All rights reserved.
KeywordNanomaterials Microstructure X-ray techniques
DOI10.1016/j.apsusc.2016.03.233
Indexed BySCI ; ADS
Language英语
WOS IDWOS:000376819200025
ADS Bibcode2016ApSS..378..191C
ADS URLhttps://ui.adsabs.harvard.edu/abs/2016ApSS..378..191C
ADS CITATIONShttps://ui.adsabs.harvard.edu/abs/2016ApSS..378..191C/citations
Citation statistics
Cited Times:3 [ADS]
Document Type期刊论文
Identifierhttp://ir.ihep.ac.cn/handle/311005/248105
Collection中国科学院高能物理研究所
Recommended Citation
GB/T 7714
Chen, HJ,Wang, YH,Zhang, XJ,et al. Structure analysis of bimetallic Co-Au nanoparticles formed by sequential ion implantation[J]. APPLIED SURFACE SCIENCE,2016,378:191-195.
APA Chen, HJ.,Wang, YH.,Zhang, XJ.,Song, SP.,Chen, H.,...&郑黎荣.(2016).Structure analysis of bimetallic Co-Au nanoparticles formed by sequential ion implantation.APPLIED SURFACE SCIENCE,378,191-195.
MLA Chen, HJ,et al."Structure analysis of bimetallic Co-Au nanoparticles formed by sequential ion implantation".APPLIED SURFACE SCIENCE 378(2016):191-195.
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