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Electrical conductivity measurements of beta-boron under high pressure and temperature
Zhang, DM; Gao, CX; Ma, YZ; He, CY; Huang, XW; Hao, AM; Yu, CL; Li, YC; Liu, J; Peng, G; Li, DM; Liu, HW; Zou, G; Li YC(李延春); Liu J(刘景)
2007
发表期刊JOURNAL OF PHYSICS-CONDENSED MATTER
卷号19期号:42页码:425216
通讯作者Jilin Univ, Inst Atom & Mol Phys, Natl Lab Superhard Mat, Changchun 130012, Peoples R China ; Texas Tech Univ, Dept Mech Engn, Lubbock, TX 79409 USA ; Chinese Acad Sci, Inst High Energy Phys, Beijing Synchrotron Radiat Labs, Beijing 100039, Peoples R China
文章类型Article; Proceedings Paper
摘要Using a microcircuit fabricated on a diamond anvil cell, we carried out in situ conductivity measurements on beta-boron at pressures up to 28 GPa. The electrical conductivity of the sample increases with increasing pressure, but it does not return to original state when the pressure returns to ambient. As the conductivity gradually increases within a temperature region from 293 to 473 K, two significant different conduction processes are observed. A possible reason for this result is proposed based on the valence band structure. In addition, by laser heating, our experimental result indicates that beta-boron still shows the transport behavior of a semiconductor.
学科领域Physics
研究领域[WOS]Physics ; Physics
DOI10.1088/0953-8984/19/42/425216
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语种英语
研究领域[WOS]Physics ; Physics
WOS类目Physics, Condensed Matter
WOS记录号WOS:000249987500017
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文献类型期刊论文
条目标识符http://ir.ihep.ac.cn/handle/311005/241064
专题多学科研究中心
中国科学院高能物理研究所_科研计划处
作者单位中国科学院高能物理研究所
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GB/T 7714
Zhang, DM,Gao, CX,Ma, YZ,et al. Electrical conductivity measurements of beta-boron under high pressure and temperature[J]. JOURNAL OF PHYSICS-CONDENSED MATTER,2007,19(42):425216.
APA Zhang, DM.,Gao, CX.,Ma, YZ.,He, CY.,Huang, XW.,...&刘景.(2007).Electrical conductivity measurements of beta-boron under high pressure and temperature.JOURNAL OF PHYSICS-CONDENSED MATTER,19(42),425216.
MLA Zhang, DM,et al."Electrical conductivity measurements of beta-boron under high pressure and temperature".JOURNAL OF PHYSICS-CONDENSED MATTER 19.42(2007):425216.
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