Chinese Acad Sci, Inst High Energy Phys, Beijing Synchrotron Radiat Facil, Beijing 100039, Peoples R China
; Pohang Univ Sci & Technol, Pohang Accelerator Lab, Pohang 790784, South Korea
; Pohang Univ Sci & Technol, Dept Phys, Pohang 790784, South Korea
; Hebrew Univ Jerusalem, Racah Inst Phys, IL-91904 Jerusalem, Israel
The interfacial structures of self-assembled heterostructures through alternate deposition of conjugated and nonconjugated polymers were studied by x-ray reflectivity and nonspecular scattering. We found that the interfacial width including the effects of both interdiffusion and interfacial roughness (correlated) was mainly contributed by the latter one. The self-assembled deposition induced very small interdiffusion between layers. The lateral correlation length xi(parallel to) grew as a function of deposition time (or film thickness) described by a power law xi(parallel to)proportional tot(beta/H) and was also observed from the off-specular scattering.