Small-Angle X-Ray Scattering Study on Nanostructures of Polyimide Films
Liu, XX; Yin, JH; Sun, DB; Bu, WB; Cheng, WD; Wu, ZH; Cheng WD(程伟东); Wu ZH(吴忠华)
刊名CHINESE PHYSICS LETTERS
2010
卷号27期号:9页码:96103
学科分类Physics
DOI10.1088/0256-307X/27/9/096103
通讯作者[Liu Xiao-Xu ; Yin Jing-Hua ; Bu Wen-Bin] Harbin Univ Sci & Technol, Sch Appl Sci, Harbin 150080, Peoples R China ; [Liu Xiao-Xu ; Sun Dao-Bin] Heilongjiang Inst Sci & Technol, Harbin 150027, Peoples R China ; [Cheng Wei-Dong ; Wu Zhong-Hua] Chinese Acad Sci, Inst High Energy Phys, Beijing 100049, Peoples R China ; [Yin Jing-Hua] Harbin Univ Sci & Technol, Minist Educ, Key Lab Engn Dielect & Applicat, Harbin 150080, Peoples R China
文章类型Article
英文摘要Inorganic nanohybrid polyimide (PI) is widely applied in electrical and electronic devices for its outstanding insulating properties. Samples 100CR and 100NH are made in Dupont. Among them, 100NH is a kind of pure PI films; however, 100CR is a kind of inorganic nanohybrid PI films with excellent corona-resistance. The nanostructure of PI films is investigated with small-angle x-ray scattering technique and transmission electron microscopy (TEM). The normalized volume fractions of the scatterers in the specimens are obtained with a tangent-by-tangent data analysis for the small-angle x-ray scattering data. The multi-hierarchical scatterers of 100NH can be divided into two dominant components, i.e., the sharp component and the wide component. The sharp component is corresponding to the contribution of PI molecular chains, and the wide component includes the aggregates formed by PI molecular chains and the film has nested dual-fractal characteristics, nevertheless the 100CR film possesses three types of scale scattering made up of inorganic nanoparticles, molecular chains and aggregates. The present films have multi-fractal structures. The distribution and structure of scattering body of two kinds of PI films are analyzed. The results of SAXS agree well with those of TEM methods.
类目[WOS]Physics, Multidisciplinary
研究领域[WOS]Physics
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语种英语
WOS记录号WOS:000281546300042
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被引频次:4[WOS]   [WOS记录]     [WOS相关记录]
文献类型期刊论文
条目标识符http://ir.ihep.ac.cn/handle/311005/240894
专题中国科学院高能物理研究所_多学科研究中心_期刊论文
作者单位中国科学院高能物理研究所
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Liu, XX,Yin, JH,Sun, DB,et al. Small-Angle X-Ray Scattering Study on Nanostructures of Polyimide Films[J]. CHINESE PHYSICS LETTERS,2010,27(9):96103.
APA Liu, XX.,Yin, JH.,Sun, DB.,Bu, WB.,Cheng, WD.,...&吴忠华.(2010).Small-Angle X-Ray Scattering Study on Nanostructures of Polyimide Films.CHINESE PHYSICS LETTERS,27(9),96103.
MLA Liu, XX,et al."Small-Angle X-Ray Scattering Study on Nanostructures of Polyimide Films".CHINESE PHYSICS LETTERS 27.9(2010):96103.
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