Room-temperature microstructural evolution of electroplated Cu studied by focused ion beam and positron annihilation lifetime spectroscopy
Yin, KB; Xia, YD; Zhang, WQ; Wang, QJ; Zhao, XN; Li, AD; Liu, ZG; Hao, XP; Wei, L; Chan, CY; Cheung, KL; Bayes, MW; Yee, KW; Hao XP(郝小鹏); Wei L(魏龙)
刊名JOURNAL OF APPLIED PHYSICS
2008
卷号103期号:6页码:66103
学科分类Physics
DOI10.1063/1.2874497
通讯作者[Yin, K. B. ; Xia, Y. D. ; Zhang, W. Q. ; Wang, Q. J. ; Zhao, X. N. ; Li, A. D. ; Liu, Z. G.] Nanjing Univ, Natl Lab Solid State Microstruct, Nanjing 210093, Peoples R China ; [Yin, K. B. ; Xia, Y. D. ; Zhang, W. Q. ; Wang, Q. J. ; Zhao, X. N. ; Li, A. D. ; Liu, Z. G.] Nanjing Univ, Dept Mat Sci & Engn, Nanjing 210093, Peoples R China ; [Hao, X. P. ; Wei, L.] Chinese Acad Sci, Inst High Energy Phys, Beijing 100049, Peoples R China ; [Chan, C. Y. ; Cheung, K. L. ; Bayes, M. W. ; Yee, K. W.] Rohm & Haas Elect Mat Asia Ltd, Fanling, Hong Kong, Peoples R China
文章类型Article
英文摘要Focused ion beam (FIB) microscopy was used to obtain the time dependent transformation fraction and positron annihilation lifetime spectroscopy (PALS) was employed to analyze the vacancy-type defects in electroplated copper (Cu) during room-temperature microstructrual evolution. It was found that PALS is more sensitive than FIB to show the room-temperature microstructual evolution of electroplated Cu at the first stage of self-annealing. The majority of defects in electroplated Cu are dislocation-bound vacancies and vacancy clusters. Both the size and the concentration of the defects are similar for the two samples at the completion of electroplating. During the incubation time, the mean size of vacancy-type defects increases. After the onset of visible grain growth, the size of vacancy-type defects decreases. The detail evolutions of defects differ with the two samples. The role of the evolution of codeposited species was also discussed. (C) 2008 American Institute of Physics.
类目[WOS]Physics, Applied
研究领域[WOS]Physics
原文出处查看原文
语种英语
WOS记录号WOS:000254536900150
引用统计
被引频次:7[WOS]   [WOS记录]     [WOS相关记录]
文献类型期刊论文
条目标识符http://ir.ihep.ac.cn/handle/311005/240743
专题中国科学院高能物理研究所_多学科研究中心_期刊论文
作者单位中国科学院高能物理研究所
推荐引用方式
GB/T 7714
Yin, KB,Xia, YD,Zhang, WQ,et al. Room-temperature microstructural evolution of electroplated Cu studied by focused ion beam and positron annihilation lifetime spectroscopy[J]. JOURNAL OF APPLIED PHYSICS,2008,103(6):66103.
APA Yin, KB.,Xia, YD.,Zhang, WQ.,Wang, QJ.,Zhao, XN.,...&魏龙.(2008).Room-temperature microstructural evolution of electroplated Cu studied by focused ion beam and positron annihilation lifetime spectroscopy.JOURNAL OF APPLIED PHYSICS,103(6),66103.
MLA Yin, KB,et al."Room-temperature microstructural evolution of electroplated Cu studied by focused ion beam and positron annihilation lifetime spectroscopy".JOURNAL OF APPLIED PHYSICS 103.6(2008):66103.
条目包含的文件
文件名称/大小 文献类型 版本类型 开放类型 使用许可
9297.pdf(343KB)期刊论文作者接受稿开放获取CC BY-NC-SA浏览 请求全文
个性服务
推荐该条目
保存到收藏夹
查看访问统计
导出为Endnote文件
谷歌学术
谷歌学术中相似的文章
[Yin, KB]的文章
[Xia, YD]的文章
[Zhang, WQ]的文章
百度学术
百度学术中相似的文章
[Yin, KB]的文章
[Xia, YD]的文章
[Zhang, WQ]的文章
必应学术
必应学术中相似的文章
[Yin, KB]的文章
[Xia, YD]的文章
[Zhang, WQ]的文章
相关权益政策
暂无数据
收藏/分享
文件名: 9297.pdf
格式: Adobe PDF
所有评论 (0)
暂无评论
 

除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。