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Crystallization and microstructure change of semiconductor active thin layer in polymer organic field-effect transistors
Tian, XY; Zhao, SL; Xu, Z; Yao, JF; Zhang, FJ; Jia, QJ; Chen, Y; Fan, X; Gong, W; Jia QJ(贾全杰); Chen Y(陈雨)
2011
发表期刊ACTA PHYSICA SINICA
卷号60期号:2页码:27201
通讯作者[Tian Xue-Yan ; Zhao Su-Ling ; Xu Zheng ; Zhang Fu-Jun ; Fan Xing ; Gong Wei] Beijing Jiaotong Univ, Inst Optoelect Technol, Minist Educ, Key Lab Luminescence & Opt Informat, Beijing 100044, Peoples R China ; [Yao Jiang-Feng] Beijing Asahi Glass Elect Co Ltd, Beijing 100016, Peoples R China ; [Jia Quan-Jie ; Chen Yu] Chinese Acad Sci, Inst High Energy Phys, Beijing 100049, Peoples R China
文章类型Article
摘要The crystallization and microstructure change of self-organization and the related conduction mechanisms of polymer semiconductor active thin layer in polymer organic field-effect transistors (OFET) are investigated by synchrotron radiation grazing incident X-ray diffraction (GIXRD) for understanding the relationships between polymer self-organization and charge carry. The change of the crystalline microstructure of RR-P3HT clarifies the effect of SAMs for improving the interface between the insulator layer and the organic semiconductor layer. The self-organiztion of RR-P3HT modified by SAMs improves the crystalliztion to pack form the thiophene rings along the perpendicular direction of substrate and results in that the pi-pi interchains are stacked to parallel the substrate. The two-dimensional charge transport is improved. Furthermore, we find that two-dimensional, conjugated, and self-organized crystalline lamellae are easier to gain with slow grown film than with fast grown film.
关键词regioregular poly(3-hexylthiophene) organic field-effect transistors synchrotron radiation grazing incident X-ray diffraction self-organization microstructure
学科领域Physics
研究领域[WOS]Physics ; Physics
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语种英语
研究领域[WOS]Physics ; Physics
WOS类目Physics, Multidisciplinary
WOS记录号WOS:000287947000087
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被引频次:4[WOS]   [WOS记录]     [WOS相关记录]
文献类型期刊论文
条目标识符http://ir.ihep.ac.cn/handle/311005/240519
专题多学科研究中心
核技术应用研究中心
作者单位中国科学院高能物理研究所
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GB/T 7714
Tian, XY,Zhao, SL,Xu, Z,et al. Crystallization and microstructure change of semiconductor active thin layer in polymer organic field-effect transistors[J]. ACTA PHYSICA SINICA,2011,60(2):27201.
APA Tian, XY.,Zhao, SL.,Xu, Z.,Yao, JF.,Zhang, FJ.,...&陈雨.(2011).Crystallization and microstructure change of semiconductor active thin layer in polymer organic field-effect transistors.ACTA PHYSICA SINICA,60(2),27201.
MLA Tian, XY,et al."Crystallization and microstructure change of semiconductor active thin layer in polymer organic field-effect transistors".ACTA PHYSICA SINICA 60.2(2011):27201.
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