IHEP OpenIR  > 多学科研究中心
Small angle X-ray scattering study of the microstructure and interface characteristics of single crystal superalloys during creep process
Sun, GA; Chen, B; Wu, ED; Yan, GY; Huang, CQ; Li, WH; Wu, ZH; Liu, Y; Wang, J; Wu ZH(吴忠华)
2011
发表期刊ACTA PHYSICA SINICA
卷号60期号:1页码:16102
通讯作者[Sun Guang-Ai ; Chen Bo ; Yan Guan-Yun ; Huang Chao-Qiang] CAEP, Inst Nucl Phys & Chem, Mianyang 621900, Peoples R China ; [Wu Er-Dong ; Li Wu-Hui] IMR CAS, Natl Lab Mat Sci, Sehnyang 110016, Peoples R China ; [Wu Zhong-Hua] CAS, Inst High Energy Phys, Beijing 100049, Peoples R China ; [Liu Yi ; Wang Jie] CAS, Inst Shanghai Apply Phys, Shanghai 201800, Peoples R China
摘要The two-dimensional scattering patterns for micro-structural changes during creep observed by SAXS are different from that obtained by SANS technique. The changes in morphology and size characteristics of different regions of the secondary gamma' precipitates have been demonstrated by the variation of SAXS scattering intensity. The results show that the secondary gamma' precipitates have two types of feature sizes, which have similar trends of change during the creep process characterized by decreasing in the first and second stage and increasing in the final stage. As comparison shows, the larger gamma' precipitates have more noticeable changes. The elements of the secondary gamma' precipitates diffuse seriously in the second stage with the character of creep 15.h, the surfaces of gamma' phase are blurred, and interfaces of two-phase become clear again in the final stage. Due to the increasing size or the reducing number of the secondary gamma' phase, the total arcs of interfaces between the secondary gamma' precipitates and matrix phase then decreases.
文章类型Article
关键词single crystal superalloy secondary gamma ' precipitate small angle X-ray scattering microsturcture
学科领域Physics
研究领域[WOS]Physics
URL查看原文
语种英语
WOS类目Physics, Multidisciplinary
WOS记录号WOS:000287419100066
引用统计
被引频次:2[WOS]   [WOS记录]     [WOS相关记录]
文献类型期刊论文
条目标识符http://ir.ihep.ac.cn/handle/311005/240476
专题多学科研究中心
作者单位中国科学院高能物理研究所
推荐引用方式
GB/T 7714
Sun, GA,Chen, B,Wu, ED,et al. Small angle X-ray scattering study of the microstructure and interface characteristics of single crystal superalloys during creep process[J]. ACTA PHYSICA SINICA,2011,60(1):16102.
APA Sun, GA.,Chen, B.,Wu, ED.,Yan, GY.,Huang, CQ.,...&吴忠华.(2011).Small angle X-ray scattering study of the microstructure and interface characteristics of single crystal superalloys during creep process.ACTA PHYSICA SINICA,60(1),16102.
MLA Sun, GA,et al."Small angle X-ray scattering study of the microstructure and interface characteristics of single crystal superalloys during creep process".ACTA PHYSICA SINICA 60.1(2011):16102.
条目包含的文件
文件名称/大小 文献类型 版本类型 开放类型 使用许可
8675.pdf(876KB)期刊论文作者接受稿开放获取CC BY-NC-SA浏览 请求全文
个性服务
推荐该条目
保存到收藏夹
查看访问统计
导出为Endnote文件
谷歌学术
谷歌学术中相似的文章
[Sun, GA]的文章
[Chen, B]的文章
[Wu, ED]的文章
百度学术
百度学术中相似的文章
[Sun, GA]的文章
[Chen, B]的文章
[Wu, ED]的文章
必应学术
必应学术中相似的文章
[Sun, GA]的文章
[Chen, B]的文章
[Wu, ED]的文章
相关权益政策
暂无数据
收藏/分享
文件名: 8675.pdf
格式: Adobe PDF
所有评论 (0)
暂无评论
 

除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。