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Thickness dependence of microstructures in La0.8Ca0.2MnO3 thin films
Zhang, HD; Li, M; An, YK; Mai, ZH; Gao, J; Hu, FX; Wang, Y; Jia, CJ; Jia QJ(贾全杰)
2006
发表期刊JOURNAL OF APPLIED PHYSICS
卷号100期号:1页码:13911
通讯作者Chinese Acad Sci, Inst Phys, Beijing Natl Lab Condensed Matter Phys, Beijing 100080, Peoples R China ; Univ Hong Kong, Dept Phys, Hong Kong, Hong Kong, Peoples R China ; Chinese Acad Sci, Inst High Energy Phys, Beijing Synchrotron Radiat Facil, Beijing 100049, Peoples R China
摘要The thickness dependence of microstructures of La0.8Ca0.2MnO3 (LCMO)/SrTiO3 (STO) thin films was investigated by high-resolution x-ray diffraction, small angle x-ray reflection, grazing incidence x-ray diffraction, scanning electron microscopy, and atomic force microscopy. The results show that all the LCMO films are well oriented in (00l) direction perpendicular to the substrate surface. Self-organized crystalline grains with a tetragonal shape are uniformly distributed on the film surface, indicating the deposition condition being of benefit to the formation of the crystalline grains. With increasing the film thickness, the crystalline quality of the LCMO film is improved, while the surface becomes rougher. There exists a nondesigned cap layer on the upper surface of the LCMO layer for all the samples. The mechanism is discussed briefly. (c) 2006 American Institute of Physics.
文章类型Article
学科领域Physics
DOI10.1063/1.2210147
研究领域[WOS]Physics
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语种英语
WOS类目Physics, Applied
WOS记录号WOS:000239056400068
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被引频次:5[WOS]   [WOS记录]     [WOS相关记录]
文献类型期刊论文
条目标识符http://ir.ihep.ac.cn/handle/311005/240412
专题多学科研究中心
作者单位中国科学院高能物理研究所
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Zhang, HD,Li, M,An, YK,et al. Thickness dependence of microstructures in La0.8Ca0.2MnO3 thin films[J]. JOURNAL OF APPLIED PHYSICS,2006,100(1):13911.
APA Zhang, HD.,Li, M.,An, YK.,Mai, ZH.,Gao, J.,...&贾全杰.(2006).Thickness dependence of microstructures in La0.8Ca0.2MnO3 thin films.JOURNAL OF APPLIED PHYSICS,100(1),13911.
MLA Zhang, HD,et al."Thickness dependence of microstructures in La0.8Ca0.2MnO3 thin films".JOURNAL OF APPLIED PHYSICS 100.1(2006):13911.
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