IHEP OpenIR  > 多学科研究中心
Evaluation on Pore Structures of Organosilicate Thin Films by Grazing Incidence Small-Angle X-ray Scattering
Chen, HJ; Li, SY; Liu, XJ; Li, RP; Smilgies, DM; Wu, ZH; Li, ZH; Wu ZH(吴忠华); Li ZH(李志宏)
2009
Source PublicationJOURNAL OF PHYSICAL CHEMISTRY B
Volume113Issue:38Pages:12623-12627
Corresponding Author[Chen, Hong-Ji ; Li, Sheng-Ying ; Liu, Xiao-Jun] Jinan Univ, Dept Mat Sci & Engn, Guangzhou 510632, Guangdong, Peoples R China ; [Li, Rui-Peng ; Smilgies, Detlef-M.] Cornell Univ, Cornell High Energy Synchrotron Source, Ithaca, NY 14853 USA ; [Li, Rui-Peng ; Smilgies, Detlef-M.] Corning Inc, SP FR 6, Corning, NY 14830 USA ; [Wu, Zhong-Hua ; Li, Zhihong] Chinese Acad Sci, Inst High Energy Phys, Beijing Synchrotron Radiat Facil, Beijing 100039, Peoples R China
SubtypeArticle
AbstractNanoporous thin films fabricated by both a core-shell-shaped organic-inorganic hybrid sphere (octa(2,4-dinitrophenyl)silsesquioxane, ODNPSQ) and a four-leg-numbered surfactant (polyoxyethylene sorbitan monolaurate, Tween-20) for porogens in a higher molecular weight precursor (polyphenylsilsesquioxane, PPSQ) were characterized, respectively, by grazing incidence small-angle X-ray scattering (GISAXS), and the measured 2D GISAXS profiles were analyzed quantitatively by using a GISAXS formula based on the distorted wave Born approximation (DWBA). The fitted 2D GISAXS data show that the PPSQ porous thin films imprinted with ODNPSQ porogen exhibit sphere-shaped closed pores with the average pore size within a range of 1.18-3.12 nm and pore size distribution widths about 3.0 nm when the porogen loadings increase from 10 to 40 wt % and those imprinted with Tween-20 porogen give out an average pore size of 1.07-1.29 nm and pore size distribution widths about 2.0 nm with the porogen loading varying from 5 to 30 wt %. The nanoporous dielectric thin films imprinted with ODNPSQ porogen show a reducing to the molecular aggregation of porogens and significant antiphase separation behavior in the cross-linked matrix.
Subject AreaChemistry
DOI10.1021/jp905457b
URL查看原文
Language英语
WOS Research AreaChemistry
WOS SubjectChemistry, Physical
WOS IDWOS:000269747300001
Citation statistics
Document Type期刊论文
Identifierhttp://ir.ihep.ac.cn/handle/311005/240189
Collection多学科研究中心
粒子天体物理中心
理论物理室
Affiliation中国科学院高能物理研究所
First Author AffilicationInstitute of High Energy
Recommended Citation
GB/T 7714
Chen, HJ,Li, SY,Liu, XJ,et al. Evaluation on Pore Structures of Organosilicate Thin Films by Grazing Incidence Small-Angle X-ray Scattering[J]. JOURNAL OF PHYSICAL CHEMISTRY B,2009,113(38):12623-12627.
APA Chen, HJ.,Li, SY.,Liu, XJ.,Li, RP.,Smilgies, DM.,...&李志宏.(2009).Evaluation on Pore Structures of Organosilicate Thin Films by Grazing Incidence Small-Angle X-ray Scattering.JOURNAL OF PHYSICAL CHEMISTRY B,113(38),12623-12627.
MLA Chen, HJ,et al."Evaluation on Pore Structures of Organosilicate Thin Films by Grazing Incidence Small-Angle X-ray Scattering".JOURNAL OF PHYSICAL CHEMISTRY B 113.38(2009):12623-12627.
Files in This Item:
File Name/Size DocType Version Access License
7799.pdf(1169KB)期刊论文作者接受稿限制开放CC BY-NC-SAApplication Full Text
Related Services
Recommend this item
Bookmark
Usage statistics
Export to Endnote
Google Scholar
Similar articles in Google Scholar
[Chen, HJ]'s Articles
[Li, SY]'s Articles
[Liu, XJ]'s Articles
Baidu academic
Similar articles in Baidu academic
[Chen, HJ]'s Articles
[Li, SY]'s Articles
[Liu, XJ]'s Articles
Bing Scholar
Similar articles in Bing Scholar
[Chen, HJ]'s Articles
[Li, SY]'s Articles
[Liu, XJ]'s Articles
Terms of Use
No data!
Social Bookmark/Share
All comments (0)
No comment.
 

Items in the repository are protected by copyright, with all rights reserved, unless otherwise indicated.