Slow positron annihilation study of Al film reflector after proton irradiation
Wei, Q; Liu, H; He, SY; Hao, XP; Wei, L; Hao XP(郝小鹏); Wei L(魏龙)
刊名ACTA PHYSICA SINICA
2006
卷号55期号:10页码:5525-5530
关键词reflector optical property proton irradiation slow positron annihilation
学科分类Physics
通讯作者Harbin Inst Technol, Space Mat & Environm Engn Lab, Harbin 150001, Peoples R China ; Tianjin Univ, Sch Mat Sci & Engn, Tianjin 300072, Peoples R China ; Chinese Acad Sci, Key Lab Nucl Anal Tech, Inst High Energy Phys, Beijing 100049, Peoples R China
文章类型Article
英文摘要The spectral reflectance is measured after 60 keV proton irradiation by the spectrophotometer. The microscopic mechanism of irradiation damage of Al film reflector is studied by the slow positron annihilation technique and X-ray diffraction. The results show that the spectral reflectance of Al film reflectors decreases in the wavelength range of 200-800nm with increasing. proton irradiation fluence and the radiation damage is mainly concentrated on the Al film of the reflector. The implanted protons may fill the defects in Al film layer, thus decreases the electron density of Al film and enhances the interband transition of loose bound electrons. The interband transition can be excited by electromagnetic waves ranging from UV to visible and the spectral reflectance decreases in the corresponding wave band, which eventually results of the degradation of optical property of the reflector.
类目[WOS]Physics, Multidisciplinary
研究领域[WOS]Physics
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语种英语
WOS记录号WOS:000241215200091
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被引频次:7[WOS]   [WOS记录]     [WOS相关记录]
文献类型期刊论文
条目标识符http://ir.ihep.ac.cn/handle/311005/240035
专题中国科学院高能物理研究所_多学科研究中心_期刊论文
作者单位中国科学院高能物理研究所
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GB/T 7714
Wei, Q,Liu, H,He, SY,et al. Slow positron annihilation study of Al film reflector after proton irradiation[J]. ACTA PHYSICA SINICA,2006,55(10):5525-5530.
APA Wei, Q.,Liu, H.,He, SY.,Hao, XP.,Wei, L.,...&魏龙.(2006).Slow positron annihilation study of Al film reflector after proton irradiation.ACTA PHYSICA SINICA,55(10),5525-5530.
MLA Wei, Q,et al."Slow positron annihilation study of Al film reflector after proton irradiation".ACTA PHYSICA SINICA 55.10(2006):5525-5530.
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