NEAR THRESHOLD 4D PHOTOEXCITATION AND PHOTOIONIZATION OF XE
WHITFIELD, SB; CALDWELL, CD; HUANG, DX; KRAUSE, MO; Huang DX(黄达贤)
刊名JOURNAL OF PHYSICS B-ATOMIC MOLECULAR AND OPTICAL PHYSICS
1992
卷号25期号:22页码:4755-4771
学科分类Optics; Physics
DOI10.1088/0953-4075/25/22/012
通讯作者BEIJING SYNCHROTRON RADIAT LAB,INST HIGH ENERGY PHYS,BEIJING 100039,PEOPLES R CHINA ; OAK RIDGE NATL LAB,DIV CHEM,OAK RIDGE,TN 37831
文章类型Article
英文摘要The angular distribution parameter beta of the N5-O2,3O2,3 Auger lines has been measured between the 4d5/2 and the 4d3/2 thresholds of Xe using the cis technique. The radiationless decay parameter alpha2 for each of the N5-O2,3O2,3 Auger lines and the alignment parameter A20 for the intermediate ion were also determined. Comparisons with previous values of beta and alpha2 for the N5-O2,3O2,3 Auger lines have been made. In addition, shakeoff to the various states of the Xe2+ 5p4 ion has been measured following 4d photoexcitation and found to be small. These results support the contention that near-zero kinetic energy electrons observed following similar photoexcitation in the rare gases result primarily from a two-step process rather than the direct process of shakeoff.
类目[WOS]Optics ; Physics, Atomic, Molecular & Chemical
研究领域[WOS]Optics ; Physics
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语种英语
WOS记录号WOS:A1992KA75000012
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被引频次:35[WOS]   [WOS记录]     [WOS相关记录]
文献类型期刊论文
条目标识符http://ir.ihep.ac.cn/handle/311005/239997
专题中国科学院高能物理研究所_多学科研究中心_期刊论文
作者单位中国科学院高能物理研究所
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WHITFIELD, SB,CALDWELL, CD,HUANG, DX,et al. NEAR THRESHOLD 4D PHOTOEXCITATION AND PHOTOIONIZATION OF XE[J]. JOURNAL OF PHYSICS B-ATOMIC MOLECULAR AND OPTICAL PHYSICS,1992,25(22):4755-4771.
APA WHITFIELD, SB,CALDWELL, CD,HUANG, DX,KRAUSE, MO,&黄达贤.(1992).NEAR THRESHOLD 4D PHOTOEXCITATION AND PHOTOIONIZATION OF XE.JOURNAL OF PHYSICS B-ATOMIC MOLECULAR AND OPTICAL PHYSICS,25(22),4755-4771.
MLA WHITFIELD, SB,et al."NEAR THRESHOLD 4D PHOTOEXCITATION AND PHOTOIONIZATION OF XE".JOURNAL OF PHYSICS B-ATOMIC MOLECULAR AND OPTICAL PHYSICS 25.22(1992):4755-4771.
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