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Diffraction enhanced imaging: a simple model
Zhu PP(朱佩平); Yuan QX(袁清习); Huang WX(黄万霞); Wang JY(王寯越); Shu H(舒航); Chen B(陈博); Liu YJ(刘宜晋); Li ER(李恩荣); Wu ZY(吴自玉); Zhu, PP; Yuan, QX; Huang, WX; Wang, JY; Shu, H; Chen, B; Liu, YJ; Li, ER; Wu, ZY
2006
Source PublicationJOURNAL OF PHYSICS D-APPLIED PHYSICS
Volume39Issue:19Pages:4142-4147
Corresponding AuthorChinese Acad Sci, Inst High Energy Phys, Beijing Synchrotron Radiat Facil, Beijing 100049, Peoples R China
SubtypeArticle
AbstractBased on pinhole imaging and conventional x-ray projection imaging, a more general DEI (diffraction enhanced imaging) equation is derived using simple concepts in this paper. Not only can the new DEI equation explain all the same problems as with the DEI equation proposed by Chapman, but also some problems that cannot be explained with the old DEI equation, such as the noise background caused by small angle scattering diffracted by the analyser.
Subject AreaPhysics
DOI10.1088/0022-3727/39/19/004
URL查看原文
Indexed ByADS
Language英语
WOS Research AreaPhysics
WOS SubjectPhysics, Applied
WOS IDWOS:000241542800005
ADS Bibcode2006JPhD...39.4142Z
ADS URLhttps://ui.adsabs.harvard.edu/abs/2006JPhD...39.4142Z
ADS CITATIONShttps://ui.adsabs.harvard.edu/abs/2006JPhD...39.4142Z/citations
Citation statistics
Cited Times:19 [ADS]
Document Type期刊论文
Identifierhttp://ir.ihep.ac.cn/handle/311005/239963
Collection多学科研究中心
加速器中心
Affiliation中国科学院高能物理研究所
First Author AffilicationInstitute of High Energy
Recommended Citation
GB/T 7714
Zhu PP,Yuan QX,Huang WX,et al. Diffraction enhanced imaging: a simple model[J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS,2006,39(19):4142-4147.
APA 朱佩平.,袁清习.,黄万霞.,王寯越.,舒航.,...&Wu, ZY.(2006).Diffraction enhanced imaging: a simple model.JOURNAL OF PHYSICS D-APPLIED PHYSICS,39(19),4142-4147.
MLA 朱佩平,et al."Diffraction enhanced imaging: a simple model".JOURNAL OF PHYSICS D-APPLIED PHYSICS 39.19(2006):4142-4147.
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