IHEP OpenIR  > 多学科研究中心
The effect of film thickness on the microstructure of La0.5Ca0.5MnO3 films
Chen, XM; Wang, Y; Liu, CX; Zhao, YN; Mai, ZH; Gong, WZ; Zhao, BR; Jia, CJ; Zheng, WL; Zheng WL(郑文莉)
2002
发表期刊INTERNATIONAL JOURNAL OF MODERN PHYSICS B
卷号16期号:23页码:3439-3447
通讯作者Chinese Acad Sci, Inst Phys, Natl Lab Superconduct, Beijing 100080, Peoples R China ; Chinese Acad Sci, Ctr Condensed Matter Phys, Beijing 100080, Peoples R China ; Chinese Acad Sci, Inst High Energy Phys, Beijing Synchrotron Radiat Facil, Beijing 100039, Peoples R China
文章类型Article
摘要La0.5Ca0.5MnO3 (LCMO) thin films grown on SrTiO3 substrate with different thickness were investigated using high resolution X-ray diffraction, small angle reflectivity, and atomic force microscope (AFM). All the films are demonstrated to be c-axis oriented. The surface and interface structure of the films were obtained. It was found that the surface morphology of the films strongly depends on the thickness, and the film will crack when the thickness of the film reach a critical thickness. The surface roughness of the films increases with the thickness. The interface between the films and the substrates are very clear. There exists a non-designed cap layer on the surface of the LCMO layer.
关键词microstructure surface interface
学科领域Physics
研究领域[WOS]Physics ; Physics
DOI10.1142/S0217979202012086
URL查看原文
语种英语
研究领域[WOS]Physics ; Physics
WOS类目Physics, Applied ; Physics, Condensed Matter ; Physics, Mathematical
WOS记录号WOS:000178300300004
引用统计
被引频次:3[WOS]   [WOS记录]     [WOS相关记录]
文献类型期刊论文
条目标识符http://ir.ihep.ac.cn/handle/311005/239916
专题多学科研究中心
中国科学院高能物理研究所_人力资源处
作者单位中国科学院高能物理研究所
推荐引用方式
GB/T 7714
Chen, XM,Wang, Y,Liu, CX,et al. The effect of film thickness on the microstructure of La0.5Ca0.5MnO3 films[J]. INTERNATIONAL JOURNAL OF MODERN PHYSICS B,2002,16(23):3439-3447.
APA Chen, XM.,Wang, Y.,Liu, CX.,Zhao, YN.,Mai, ZH.,...&郑文莉.(2002).The effect of film thickness on the microstructure of La0.5Ca0.5MnO3 films.INTERNATIONAL JOURNAL OF MODERN PHYSICS B,16(23),3439-3447.
MLA Chen, XM,et al."The effect of film thickness on the microstructure of La0.5Ca0.5MnO3 films".INTERNATIONAL JOURNAL OF MODERN PHYSICS B 16.23(2002):3439-3447.
条目包含的文件
文件名称/大小 文献类型 版本类型 开放类型 使用许可
7328.pdf(900KB)期刊论文作者接受稿限制开放CC BY-NC-SA请求全文
个性服务
推荐该条目
保存到收藏夹
查看访问统计
导出为Endnote文件
谷歌学术
谷歌学术中相似的文章
[Chen, XM]的文章
[Wang, Y]的文章
[Liu, CX]的文章
百度学术
百度学术中相似的文章
[Chen, XM]的文章
[Wang, Y]的文章
[Liu, CX]的文章
必应学术
必应学术中相似的文章
[Chen, XM]的文章
[Wang, Y]的文章
[Liu, CX]的文章
相关权益政策
暂无数据
收藏/分享
所有评论 (0)
暂无评论
 

除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。