China Inst Atom Energy, Beijing 102413, Peoples R China
; Huazhong Univ Sci & Technol, Dept Mat Sci & Engn, Wuhan 430074, Peoples R China
; Chinese Acad Sci, Inst High Energy Phys, Lab Synchrotron Radiat, Beijing 100039, Peoples R China
The structural relaxation of Zr55Cu30Al10Ni5 bulk amorphous alloy during annealing at 360 and 380degreesC have been investigated by in-situ synchrotron radiation x-ray small angle scattering (SAXS). The experimental results obtained show that the fluctuations of electron density during the annealing process are due to structural relaxations of bulk amorphous alloy before cyrstallization. It is found that a homogenization in electron density takes place during annealing, which is attributed to the change from topological short-range order (TSRO) structural relaxation to chemical short-range order (CSRO) structural relaxation. The annealing time required for this change becomes shorter as the annealing temperature increases.