Chinese Acad Sci, Inst Coal Chem, State Key Lab Coal Convers, Taiyuan 030001, Peoples R China
; Chinese Acad Sci, Inst High Energy Phys, Synchrotron Radiat Lab, Beijing 100039, Peoples R China
The Debye equation with slit-smeared small angle x-ray scattering (SAXS) data is extended from an ideal two-phase system to a pseudo two-phase system with the presence of the interface layer, and a simple accurate solution is proposed to determine the average thickness of the interface layer in porous materials. This method is tested by experimental SAXS data, which were measured at 25 degreesC, of organo-modified mesoporous silica prepared by condensation of tetraethoxysilane (TEOS) and methyltriethoxysilane (MTES) using non-ionic neutral surfactant as template under neutral condition.
Li, ZH,Gong, YJ,Pu, M,et al. Determination of interface layer thickness of a pseudo two-phase system by extension of the Debye equation[J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS,2001,34(14):2085-2088.
Li, ZH.,Gong, YJ.,Pu, M.,Wu, D.,Sun, YH.,...&董宝中.(2001).Determination of interface layer thickness of a pseudo two-phase system by extension of the Debye equation.JOURNAL OF PHYSICS D-APPLIED PHYSICS,34(14),2085-2088.
Li, ZH,et al."Determination of interface layer thickness of a pseudo two-phase system by extension of the Debye equation".JOURNAL OF PHYSICS D-APPLIED PHYSICS 34.14(2001):2085-2088.