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Determination of interface layer thickness of a pseudo two-phase system by extension of the Debye equation
Li, ZH; Gong, YJ; Pu, M; Wu, D; Sun, YH; Wang, J; Liu, Y; Dong, BZ; Wang J(王俊); Liu Y(柳义); Dong BZ(董宝中)
2001
发表期刊JOURNAL OF PHYSICS D-APPLIED PHYSICS
卷号34期号:14页码:2085-2088
通讯作者Chinese Acad Sci, Inst Coal Chem, State Key Lab Coal Convers, Taiyuan 030001, Peoples R China ; Chinese Acad Sci, Inst High Energy Phys, Synchrotron Radiat Lab, Beijing 100039, Peoples R China
文章类型Article
摘要The Debye equation with slit-smeared small angle x-ray scattering (SAXS) data is extended from an ideal two-phase system to a pseudo two-phase system with the presence of the interface layer, and a simple accurate solution is proposed to determine the average thickness of the interface layer in porous materials. This method is tested by experimental SAXS data, which were measured at 25 degreesC, of organo-modified mesoporous silica prepared by condensation of tetraethoxysilane (TEOS) and methyltriethoxysilane (MTES) using non-ionic neutral surfactant as template under neutral condition.
学科领域Physics
研究领域[WOS]Physics ; Physics
DOI10.1088/0022-3727/34/14/301
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语种英语
研究领域[WOS]Physics ; Physics
WOS类目Physics, Applied
WOS记录号WOS:000170361000003
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被引频次:21[WOS]   [WOS记录]     [WOS相关记录]
文献类型期刊论文
条目标识符http://ir.ihep.ac.cn/handle/311005/239647
专题多学科研究中心
作者单位中国科学院高能物理研究所
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GB/T 7714
Li, ZH,Gong, YJ,Pu, M,et al. Determination of interface layer thickness of a pseudo two-phase system by extension of the Debye equation[J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS,2001,34(14):2085-2088.
APA Li, ZH.,Gong, YJ.,Pu, M.,Wu, D.,Sun, YH.,...&董宝中.(2001).Determination of interface layer thickness of a pseudo two-phase system by extension of the Debye equation.JOURNAL OF PHYSICS D-APPLIED PHYSICS,34(14),2085-2088.
MLA Li, ZH,et al."Determination of interface layer thickness of a pseudo two-phase system by extension of the Debye equation".JOURNAL OF PHYSICS D-APPLIED PHYSICS 34.14(2001):2085-2088.
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