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Simulation study of real-time monitor for BEPC-II luminosity
Shan, Q; Wu, J; Xue, Z; Xu, ZZ; Hu, T; Wang, YF; Wang, XL; Hu T(胡涛); Wang YF(王贻芳)
2010
发表期刊SCIENCE CHINA-TECHNOLOGICAL SCIENCES
卷号53期号:5页码:1215-1219
通讯作者[Shan Qing] Nanjing Univ Aeronaut & Astronaut, Coll Mat Sci & Technol, Nanjing 210016, Peoples R China ; [Shan Qing ; Wu Jian ; Xue Zhen ; Xu ZiZong ; Wang XiaoLian] Univ Sci & Technol China, Dept Modern Phys, Hefei 230026, Peoples R China ; [Hu Tao ; Wang YiFang] Chinese Acad Sci, Inst High Energy Phys, Beijing 100049, Peoples R China
文章类型Article
摘要A fast and real time luminosity monitor system will be used in the BEPC-II (Beijing Electron Positron Collider, China). Photons generated in radiative Bhabha scattering at the interaction point are transformed into charged particles, and then the luminosity of each bunch pair is measured through collecting the Cherenkov light produced by charged particles in fused silica. The whole process happening in the detector is simulated. The physics acceptance and detection threshold with the monitor accuracy of 1% are set based on the simulation spectra of photoelectron yield calibrated by e(-) beam data.
关键词luminosity BEPC-II Cherenkov detector radiative Bhabha
学科领域Engineering; Materials Science
研究领域[WOS]Engineering ; Materials Science ; Engineering ; Materials Science
DOI10.1007/s11431-010-0130-4
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语种英语
研究领域[WOS]Engineering ; Materials Science ; Engineering ; Materials Science
WOS类目Engineering, Multidisciplinary ; Materials Science, Multidisciplinary
WOS记录号WOS:000277418100008
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文献类型期刊论文
条目标识符http://ir.ihep.ac.cn/handle/311005/239196
专题院士
作者单位中国科学院高能物理研究所
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Shan, Q,Wu, J,Xue, Z,et al. Simulation study of real-time monitor for BEPC-II luminosity[J]. SCIENCE CHINA-TECHNOLOGICAL SCIENCES,2010,53(5):1215-1219.
APA Shan, Q.,Wu, J.,Xue, Z.,Xu, ZZ.,Hu, T.,...&王贻芳.(2010).Simulation study of real-time monitor for BEPC-II luminosity.SCIENCE CHINA-TECHNOLOGICAL SCIENCES,53(5),1215-1219.
MLA Shan, Q,et al."Simulation study of real-time monitor for BEPC-II luminosity".SCIENCE CHINA-TECHNOLOGICAL SCIENCES 53.5(2010):1215-1219.
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