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Sulfidation growth and characterization of nanocrystalline ZnS thin films
Zhang, RG; Wang BY(王宝义); Wei L(魏龙); Wang, BY; Wei, L
2008
发表期刊VACUUM
卷号82期号:11页码:1208-1211
通讯作者[Zhang, Rengang] Wuhan Univ Sci & Technol, Dept Appl Phys, Wuhan 430081, Peoples R China ; [Wang, Baoyi ; Wei, Long] Chinese Acad Sci, Inst High Energy Phys, Beijing 100049, Peoples R China
文章类型Article
摘要Nanocrystalline ZnS thin films are prepared on glass and quartz substrates by sulfurizing ZnO thin films in the H2S-containing mixture at 500 degrees C. These films are investigated by X-ray diffraction, scanning electron morphology, optical transmittance and photoluminescence spectra. The results show that the ZnS thin films have the hexagonal structure with a c-axis preferred orientation. Also, these nanostructure ZnS thin films with the grain size of similar to 50 nm along the c-axis, exhibit the optical transparency as high as similar to 80% in the visible region. It is found that sulfur replacement of oxygen sites in crystal lattices and recrystallization can take place during sulfidation, resulting in an evident increase of the grain size for the sulfurized films. Under the optimum sulfidation time of 2 h, the resultant ZnS thin films have a high crystallinity, low defect concentration and good optical properties with the band gap of 3.66 eV. (C) 2008 Elsevier Ltd. All rights reserved.
关键词ZnS thin film ZnO thin film reactive magnetron sputtering sulfidation
学科领域Materials Science; Physics
研究领域[WOS]Materials Science ; Physics ; Materials Science ; Physics
DOI10.1016/j.vacuum.2008.02.003
URL查看原文
语种英语
研究领域[WOS]Materials Science ; Physics ; Materials Science ; Physics
WOS类目Materials Science, Multidisciplinary ; Physics, Applied
WOS记录号WOS:000257632400013
引用统计
文献类型期刊论文
条目标识符http://ir.ihep.ac.cn/handle/311005/239183
专题多学科研究中心
作者单位中国科学院高能物理研究所
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GB/T 7714
Zhang, RG,Wang BY,Wei L,et al. Sulfidation growth and characterization of nanocrystalline ZnS thin films[J]. VACUUM,2008,82(11):1208-1211.
APA Zhang, RG,王宝义,魏龙,Wang, BY,&Wei, L.(2008).Sulfidation growth and characterization of nanocrystalline ZnS thin films.VACUUM,82(11),1208-1211.
MLA Zhang, RG,et al."Sulfidation growth and characterization of nanocrystalline ZnS thin films".VACUUM 82.11(2008):1208-1211.
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