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In Situ Observation of the Microstructure-evolution in Silicon Nitride Ceramics Sintering by Synchrotron Radiation X-ray Computed Tomography
Xu, F; Hu, XF; Zhao, JH; Yuan, QX; Yuan QX(袁清习)
2009
发表期刊ACTA CHIMICA SINICA
卷号67期号:11页码:1205-1210
通讯作者[Xu Feng ; Hu Xiaofang ; Zhao Jianhua] Univ Sci & Technol China, Chinese Acad Sci, Key Lab Mech Behav & Design Mat, Hefei 230026, Peoples R China ; [Yuan Qingxi] Chinese Acad Sci, Inst High Energy Phys, Beijing 100039, Peoples R China
文章类型Article
摘要Microstructure-evolution of the silicon nitride ceramics sample during sintering process was investigated by a synchrotron radiation X-ray computed tomography (SR-CT) technique. The projection images of the sample were obtained during the sintering process in real-time. 2-D and 3-D reconstructed images were obtained by treating the projection images of different sintering periods with filter back projection arithmetic and digital image processing methods. From the reconstructed images, three sintering stages of the silicon nitride ceramic sample were clearly distinguished and several sintering phenomena during the sintering process such as grain contact, sintering neck growth and pore spheroidization were observed. Densification rate of sintering process was analyzed from the porosity-time logarithm curve, which was obtained from the reconstructed images of silicon nitride ceramic sample at different sintering time. The three sintering stages and linear relationship between porosity and time logarithm in the middle stage of sintering which has already been described in the traditional sintering theories were clearly observed from the porosity-time logarithm curve. The experiment results are in concordance with the sintering theory and provide effective experimental data for further analysis of the sintering process and the mechanical characteristics of ceramics.
关键词analysis and testing technology of materials sintering synchrotron radiation X-ray computed tomography silicon nitride ceramic microstructure evolution
学科领域Chemistry
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语种英语
WOS研究方向Chemistry
WOS类目Chemistry, Multidisciplinary
WOS记录号WOS:000267606400009
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被引频次:2[WOS]   [WOS记录]     [WOS相关记录]
文献类型期刊论文
条目标识符http://ir.ihep.ac.cn/handle/311005/239176
专题多学科研究中心
作者单位中国科学院高能物理研究所
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GB/T 7714
Xu, F,Hu, XF,Zhao, JH,et al. In Situ Observation of the Microstructure-evolution in Silicon Nitride Ceramics Sintering by Synchrotron Radiation X-ray Computed Tomography[J]. ACTA CHIMICA SINICA,2009,67(11):1205-1210.
APA Xu, F,Hu, XF,Zhao, JH,Yuan, QX,&袁清习.(2009).In Situ Observation of the Microstructure-evolution in Silicon Nitride Ceramics Sintering by Synchrotron Radiation X-ray Computed Tomography.ACTA CHIMICA SINICA,67(11),1205-1210.
MLA Xu, F,et al."In Situ Observation of the Microstructure-evolution in Silicon Nitride Ceramics Sintering by Synchrotron Radiation X-ray Computed Tomography".ACTA CHIMICA SINICA 67.11(2009):1205-1210.
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