Chinese Acad Sci, State Key Lab Coal Convers, Inst Coal Chem, Taiyuan 030001, Peoples R China
; Chinese Acad Sci, Inst High Energy Phys, Lab Synchrotron Radiat, Beijing 100039, Peoples R China
The average thickness of the interface layer wrapped about sols usually is determined by fitting the Pored curve that shows a negative deviation from Pored's law. In this paper we show that it could also be determined by a new method that includes the following steps:(1) determining the average radius R-1 of the sol particles including interface layer from the small angle X-ray scattering data in which shows negative deviation from Pored's law;(2) determining the average radius R-2 of the sol particles not including the interface layer from the scattering data in which has been corrected the negative deviation from Pored's law;(3) the difference DeltaR between R-1 and R-2, i.e. DeltaR = R-1 - R-2 , is just the average thickness of the interface layer wrapped about sols. By using the above method,the average thickness of the interface layer wrapped about SiO2 sols prepared under different conditions were determined.