Determination of the average thickness of interface layer wrapped about SiO2 sols by saxs
Li, ZH; Gong, YJ; Wu, D; Sun, YH; Wang, J; Liu, Y; Dong, BZ; Wang J(王俊); Liu Y(柳义); Dong BZ(董宝中)
刊名ACTA PHYSICA SINICA
2001
卷号50期号:6页码:1128-1131
关键词small angle X-ray scattering sols the average thickness of interface layer
学科分类Physics
通讯作者Chinese Acad Sci, State Key Lab Coal Convers, Inst Coal Chem, Taiyuan 030001, Peoples R China ; Chinese Acad Sci, Inst High Energy Phys, Lab Synchrotron Radiat, Beijing 100039, Peoples R China
文章类型Article
英文摘要The average thickness of the interface layer wrapped about sols usually is determined by fitting the Pored curve that shows a negative deviation from Pored's law. In this paper we show that it could also be determined by a new method that includes the following steps:(1) determining the average radius R-1 of the sol particles including interface layer from the small angle X-ray scattering data in which shows negative deviation from Pored's law;(2) determining the average radius R-2 of the sol particles not including the interface layer from the scattering data in which has been corrected the negative deviation from Pored's law;(3) the difference DeltaR between R-1 and R-2, i.e. DeltaR = R-1 - R-2 , is just the average thickness of the interface layer wrapped about sols. By using the above method,the average thickness of the interface layer wrapped about SiO2 sols prepared under different conditions were determined.
类目[WOS]Physics, Multidisciplinary
研究领域[WOS]Physics
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语种英语
WOS记录号WOS:000169036700024
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被引频次:7[WOS]   [WOS记录]     [WOS相关记录]
文献类型期刊论文
条目标识符http://ir.ihep.ac.cn/handle/311005/239090
专题中国科学院高能物理研究所_多学科研究中心_期刊论文
作者单位中国科学院高能物理研究所
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GB/T 7714
Li, ZH,Gong, YJ,Wu, D,et al. Determination of the average thickness of interface layer wrapped about SiO2 sols by saxs[J]. ACTA PHYSICA SINICA,2001,50(6):1128-1131.
APA Li, ZH.,Gong, YJ.,Wu, D.,Sun, YH.,Wang, J.,...&董宝中.(2001).Determination of the average thickness of interface layer wrapped about SiO2 sols by saxs.ACTA PHYSICA SINICA,50(6),1128-1131.
MLA Li, ZH,et al."Determination of the average thickness of interface layer wrapped about SiO2 sols by saxs".ACTA PHYSICA SINICA 50.6(2001):1128-1131.
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