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A full-pattern fitting algorithm for energy-dispersive X-ray diffraction
Dong YH(董宇辉); Liu J(刘景); Li YC(李延春); Li XD(李晓东); Dong, YH; Liu, J; Li, YC; Li, XD
2003
Source PublicationJOURNAL OF APPLIED CRYSTALLOGRAPHY
Volume36Issue:5Pages:1123-1127
Corresponding AuthorChinese Acad Sci, Inst High Energy Phys, BSRF, Beijing 100039, Peoples R China
SubtypeArticle
AbstractA full-pattern fitting algorithm for energy-dispersive X-ray diffraction is proposed, especially for high-pressure X-ray diffraction studies. The algorithm takes into account the errors in measuring the energy and the diffraction angle. A lognormal function is introduced to represent the background. All the peaks that are detectable in the diffraction spectra, including fluorescence and diffraction peaks, are considered together. Because all the data points in the spectra are used, the accuracy of the cell parameters obtained by this method is very high. This is very helpful in the analysis of the equation of state and the identification of new phases under high pressure.
Subject AreaCrystallography
DOI10.1107/S0021889803012597
URL查看原文
Language英语
WOS Research AreaCrystallography
WOS SubjectCrystallography
WOS IDWOS:000185178600003
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Document Type期刊论文
Identifierhttp://ir.ihep.ac.cn/handle/311005/239086
Collection多学科研究中心
Affiliation中国科学院高能物理研究所
First Author AffilicationInstitute of High Energy
Recommended Citation
GB/T 7714
Dong YH,Liu J,Li YC,et al. A full-pattern fitting algorithm for energy-dispersive X-ray diffraction[J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY,2003,36(5):1123-1127.
APA 董宇辉.,刘景.,李延春.,李晓东.,Dong, YH.,...&Li, XD.(2003).A full-pattern fitting algorithm for energy-dispersive X-ray diffraction.JOURNAL OF APPLIED CRYSTALLOGRAPHY,36(5),1123-1127.
MLA 董宇辉,et al."A full-pattern fitting algorithm for energy-dispersive X-ray diffraction".JOURNAL OF APPLIED CRYSTALLOGRAPHY 36.5(2003):1123-1127.
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