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A full-pattern fitting algorithm for energy-dispersive X-ray diffraction
Dong YH(董宇辉); Liu J(刘景); Li YC(李延春); Li XD(李晓东); Dong, YH; Liu, J; Li, YC; Li, XD
2003
发表期刊JOURNAL OF APPLIED CRYSTALLOGRAPHY
卷号36期号:5页码:1123-1127
通讯作者Chinese Acad Sci, Inst High Energy Phys, BSRF, Beijing 100039, Peoples R China
摘要A full-pattern fitting algorithm for energy-dispersive X-ray diffraction is proposed, especially for high-pressure X-ray diffraction studies. The algorithm takes into account the errors in measuring the energy and the diffraction angle. A lognormal function is introduced to represent the background. All the peaks that are detectable in the diffraction spectra, including fluorescence and diffraction peaks, are considered together. Because all the data points in the spectra are used, the accuracy of the cell parameters obtained by this method is very high. This is very helpful in the analysis of the equation of state and the identification of new phases under high pressure.
文章类型Article
学科领域Crystallography
研究领域[WOS]Crystallography
DOI10.1107/S0021889803012597
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语种英语
WOS类目Crystallography
WOS记录号WOS:000185178600003
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被引频次:7[WOS]   [WOS记录]     [WOS相关记录]
文献类型期刊论文
条目标识符http://ir.ihep.ac.cn/handle/311005/239086
专题多学科研究中心
作者单位中国科学院高能物理研究所
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GB/T 7714
Dong YH,Liu J,Li YC,et al. A full-pattern fitting algorithm for energy-dispersive X-ray diffraction[J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY,2003,36(5):1123-1127.
APA 董宇辉.,刘景.,李延春.,李晓东.,Dong, YH.,...&Li, XD.(2003).A full-pattern fitting algorithm for energy-dispersive X-ray diffraction.JOURNAL OF APPLIED CRYSTALLOGRAPHY,36(5),1123-1127.
MLA 董宇辉,et al."A full-pattern fitting algorithm for energy-dispersive X-ray diffraction".JOURNAL OF APPLIED CRYSTALLOGRAPHY 36.5(2003):1123-1127.
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