IHEP OpenIR  > 多学科研究中心
New soft X-ray facility SINS for surface and nanoscale science at SSLS
Yu, XJ; Wilhelmi, O; Moser, HO; Vidyaraj, SV; Gao, XY; Wee, ATS; Nyunt, T; Qian, HJ; Zheng, HW; Qian HJ(钱海杰); Zheng HW(郑红卫)
2005
发表期刊JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA
卷号144页码:1031-1034
通讯作者Natl Univ Singapore, SSLS, Singapore 117603, Singapore ; Natl Univ Singapore, Dept Phys, Singapore 117542, Singapore ; Acad Sinica, Inst High Energy Phys, Beijing 100039, Peoples R China
文章类型Article; Proceedings Paper
摘要The first soft X-ray facility at the Singapore Synchrotron Light Source was built by FMB and commissioned in 2003. Dubbed SINS for surface, interface, and nanostructure science, it covers a photon energy range from 50 to 1200 eV. The photon beam can be set to left circular, right circular or linear polarization by changing the pitch and vertical position of the vertical focusing mirror of the prefocusing optics. The typical resolution (E/Delta E) and flux are about 1000 at 10(10) photons/s or exceeding 4000 at 10(8) photons/s in a spot of about 1.5 mm x 0.2 nun on the sample. The performance of the beamline was measured using gas photoionization spectra of Ar, He, Kr, and N-2 as well as an XMCD spectrum of a Ni sample. From the Ni XMCD signal, calculation shows that the degree of circular polarization can reach 95% at 850 eV photon energy. The end-station is presently equipped with a hemispherical electron energy analyzer and typical surface science diagnostics including LEED and ion sputtering. Upgrading with an in situ STM/AFM and a growth chamber is underway which will make SINS a unique tool for in situ surface and nanoscale science studies. (c) 2005 Elsevier B.V. All rights reserved.
关键词SINS beamline monochromator XMCD photoemission
学科领域Spectroscopy
研究领域[WOS]Spectroscopy ; Spectroscopy
DOI10.1016/j.elspec.2005.01.256
URL查看原文
语种英语
研究领域[WOS]Spectroscopy ; Spectroscopy
WOS类目Spectroscopy
WOS记录号WOS:000229657100242
引用统计
被引频次:82[WOS]   [WOS记录]     [WOS相关记录]
文献类型期刊论文
条目标识符http://ir.ihep.ac.cn/handle/311005/238922
专题多学科研究中心
作者单位中国科学院高能物理研究所
推荐引用方式
GB/T 7714
Yu, XJ,Wilhelmi, O,Moser, HO,et al. New soft X-ray facility SINS for surface and nanoscale science at SSLS[J]. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA,2005,144:1031-1034.
APA Yu, XJ.,Wilhelmi, O.,Moser, HO.,Vidyaraj, SV.,Gao, XY.,...&郑红卫.(2005).New soft X-ray facility SINS for surface and nanoscale science at SSLS.JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA,144,1031-1034.
MLA Yu, XJ,et al."New soft X-ray facility SINS for surface and nanoscale science at SSLS".JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA 144(2005):1031-1034.
条目包含的文件
文件名称/大小 文献类型 版本类型 开放类型 使用许可
5995.pdf(151KB)期刊论文作者接受稿限制开放CC BY-NC-SA请求全文
个性服务
推荐该条目
保存到收藏夹
查看访问统计
导出为Endnote文件
谷歌学术
谷歌学术中相似的文章
[Yu, XJ]的文章
[Wilhelmi, O]的文章
[Moser, HO]的文章
百度学术
百度学术中相似的文章
[Yu, XJ]的文章
[Wilhelmi, O]的文章
[Moser, HO]的文章
必应学术
必应学术中相似的文章
[Yu, XJ]的文章
[Wilhelmi, O]的文章
[Moser, HO]的文章
相关权益政策
暂无数据
收藏/分享
所有评论 (0)
暂无评论
 

除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。