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Refraction angle and edge visibility in X-ray diffraction enhanced imaging
Chen Y(陈雨); Jia QJ(贾全杰); Li G(黎刚); Wang YZ(王玉柱); Xue XY(薛宪营); Jiang XM(姜晓明); Chen, Y; Jia, QJ; Li, G; Wang, YZ; Xue, XY; Jiang, XM; Chen, ZH; Pan, L; Li, HY
2007
发表期刊HIGH ENERGY PHYSICS AND NUCLEAR PHYSICS-CHINESE EDITION
卷号31期号:10页码:982-989
通讯作者Chinese Acad Sci, Inst High Energy Phys, Beijing 100049, Peoples R China ; China Japan Friendship Hosp, China Japan Friendship Inst Clin Med Sci, Dept Biochem & Mol Biol, Beijing 100029, Peoples R China
文章类型Article
摘要Diffraction-enhanced X-ray imaging could extract accurately the refraction angles of the sample, which is very important to increase the image contrast of low Z samples. In this paper, the DEI experiments with X-rays of different energies were performed both on wedge-shaped and rounded model samples. Refraction angles of the two samples were all obtained accurately, and the results agreed well with the calculations. Quantitative analyses based on Edge Visibility were performed for the wedge-shaped model sample. The results revealed that the calculated positions for the Best Edge Visibility of the slope with fixed refraction angle were calculable in good agreement with the experimental results. A quantitative research on the Edge Visibility of real tissues sample was carried out and the optimal condition for best contrast of DEI images were discussed.
关键词diffraction enhanced imaging refraction angle edge visibility best edge visibility
学科领域Physics
研究领域[WOS]Physics ; Physics
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语种英语
研究领域[WOS]Physics ; Physics
WOS类目Physics, Nuclear ; Physics, Particles & Fields
WOS记录号WOS:000249975800017
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被引频次:1[WOS]   [WOS记录]     [WOS相关记录]
文献类型期刊论文
条目标识符http://ir.ihep.ac.cn/handle/311005/238833
专题多学科研究中心
实验物理中心
加速器中心
中国科学院高能物理研究所_中国散裂中子源
作者单位中国科学院高能物理研究所
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Chen Y,Jia QJ,Li G,et al. Refraction angle and edge visibility in X-ray diffraction enhanced imaging[J]. HIGH ENERGY PHYSICS AND NUCLEAR PHYSICS-CHINESE EDITION,2007,31(10):982-989.
APA 陈雨.,贾全杰.,黎刚.,王玉柱.,薛宪营.,...&Li, HY.(2007).Refraction angle and edge visibility in X-ray diffraction enhanced imaging.HIGH ENERGY PHYSICS AND NUCLEAR PHYSICS-CHINESE EDITION,31(10),982-989.
MLA 陈雨,et al."Refraction angle and edge visibility in X-ray diffraction enhanced imaging".HIGH ENERGY PHYSICS AND NUCLEAR PHYSICS-CHINESE EDITION 31.10(2007):982-989.
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