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High resolution X-ray diffraction investigation of epitaxially grown SrTiO3 thin films by laser-MBE
Zhai, ZY; Wu, XS; Jia QJ(贾全杰); Jia, QJ
2009
发表期刊CHINESE PHYSICS C
卷号33期号:11页码:949-953
通讯作者[Zhai Zhang-Yin ; Wu Xiao-Shan] Nanjing Univ, Solid State Microstruct Lab, Nanjing 210093, Peoples R China ; [Zhai Zhang-Yin ; Wu Xiao-Shan] Nanjing Univ, Dept Phys, Nanjing 210093, Peoples R China ; [Zhai Zhang-Yin] Huaiyin Normal Univ, Jiangsu Key Lab Chem Low Dimens Mat, Huaian 223300, Peoples R China ; [Zhai Zhang-Yin] Huaiyin Normal Univ, Dept Phys, Huaian 223300, Peoples R China ; [Jia Quan-Jie] CAS, BSRF, Inst High Energy Phys, Beijing 100049, Peoples R China
摘要SrTiO3 thin films are epitaxially grown on DyScO3, LaAlO3 substrates with/without buffer layers of DyScO3 and SrRuO3 using laser-MBE. X-ray diffraction methods, such as high resolution X-ray diffraction, grazing incident X-ray diffraction, and reciprocal space mapping are used to investigate the lattice structure., dislocation density, in-plane lattice strain distribution along film thickness. From the measurement results, the effects of substrate on film lattice quality and microstructure are discussed.
文章类型Article
关键词laser-MBE grazing incident X-ray diffraction reciprocal space mapping
学科领域Physics
研究领域[WOS]Physics
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语种英语
WOS类目Physics, Nuclear ; Physics, Particles & Fields
WOS记录号WOS:000271893700003
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文献类型期刊论文
条目标识符http://ir.ihep.ac.cn/handle/311005/238790
专题多学科研究中心
作者单位中国科学院高能物理研究所
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Zhai, ZY,Wu, XS,Jia QJ,et al. High resolution X-ray diffraction investigation of epitaxially grown SrTiO3 thin films by laser-MBE[J]. CHINESE PHYSICS C,2009,33(11):949-953.
APA Zhai, ZY,Wu, XS,贾全杰,&Jia, QJ.(2009).High resolution X-ray diffraction investigation of epitaxially grown SrTiO3 thin films by laser-MBE.CHINESE PHYSICS C,33(11),949-953.
MLA Zhai, ZY,et al."High resolution X-ray diffraction investigation of epitaxially grown SrTiO3 thin films by laser-MBE".CHINESE PHYSICS C 33.11(2009):949-953.
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